[Legacy Report] Antenna Measurement with Fast Scanning Techniques

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The growing presence of wireless and electronic applications across a broad array of industries has created a high demand for effective and economic performance test measurements. Unfortunately, the acquisition and maintenance costs, and the physical real estate requirements associated with conventional chamber systems is making this more and more difficult to achieve. Furthermore, characterization of large and/or low frequency antennas in a far-field chamber or compact range measurement system is often too costly and in many cases impractical. An alternative to direct far-field measurement exists, based on very-near-field scanning. An array of electronically switched probes eliminates the need for mechanical movement of the probe and hence drastically reduces measurement time; the very-near-fields are then transformed to far-field in a hemisphere in less than a second. This technique is also scalable to an arbitrarily large antenna. Very-near-field techniques enable Antenna Engineers to quickly evaluate and optimize designs at their desk by providing over-the-air realtime performance results for antennas and wireless device.

Kasra Payandehjoo (aka Chris Payan) is EMSCAN’s Principal Antenna Engineer since 2012; prior to joining EMSCAN Kasra was an intern at Research in Motion (Blackberry). Kasra holds a Ph.D. and M.Sc. in Electrical Engineering from McGill University. He is experienced in design, development, and characterization of RF/Microwave Antennas. Kasra is also a specialist in the design, development, and testing of MIMO Systems. Kasra is an active member of the Editorial Board of the International Journal of RF and Microwave Computer-Aided Engineering (RFMiCAE). His patent work include “Reactive Near-Field Antenna Measurement,” “Method and Apparatus for Tunable Antenna and Ground Plane for Handset Applications,” “Tunable Substrate Integrated Waveguide Components,” “On-Chip Implementation of Compact Electromagnetic Bandgap Structures for 60GHz Applications,” and “Methods and Devices for Coupling Reduction in Wireless Devices.” His awards and fellowships include Sheryl and David Kerr Engineering Graduate Studies Fellowship, J. W. McConnell McGill Major Fellowship, IEEE Antennas and Propagation Society (AP-S) Scholarship, Dean’s Doctoral Student Research Recruitment Award DDSRRA (also known as McGill Engineering Doctoral Award MEDA), “IEEE 2nd Best Student Paper Award” at the ANTEM2006



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  • E. Hanover, New Jersey
  • United States

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Antenna Measurement with Fast Scanning Techniques

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