[Legacy Report] Breaking Barriers in high speed Time & Frequency Domain Measurements

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This is a two part Seminar
Part 1: Serial Data Testing Techniques, by Frank Selvaggio
Abstract: During this part of the seminar we will review the different categories and types of jitter that can be found in everyday designs. We will dig into the origins and interrelationships of these, how they can be used to diagnosis, characterize and debug system hardware, and explain how these various jitter measurements are applicable to your specific applications. Also, we will discuss common pitfalls when making jitter measurements and how you can avoid them when making your measurements. Lastly, we will show how to use modeling tools to correlate simulations with high-speed physical layer measurements on Serial Bus Standards using cutting-edge oscilloscopes and software tools.
Part 2: Modern tools for Today’s Complex RF Applications, by Alan Wolke
Abstract: In this part of the seminar we will delve into how to utilize the latest techniques for tackling the most modern day RF design challenges in signal generation and analysis. Some of the design challenges which will be covered include: frequency agility, frequency hopping, multi-channel, low duty cycle bursty transmissions and complex and wideband modulations. Utilizing today's high speed arbitrary waveform generators can make it easy to create these complex RF scenarios. Analysis of these complex signals requires wide RF capture bandwidth, live RF visibility, flexible triggering, deep memory, and multi-domain time correlated analysis. Tools such as real-time spectrum analyzers and mixed domain oscilloscopes offer these capabilities to give you a complete understanding of the performance of your RF systems.

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