April 2018 Section Meeting - EMC Chapter

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Join us for the April 2018 Section Meeting.

This meeting will be presented via live online webcast. The connection link will be provided in an email after registering. Please provide an email address during registration to ensure you receive a connection link.

Dinner will be served at Rock Valley College prior to connecting to the webcast.



  Date and Time

  Location

  Hosts

  Registration



  • Date: 26 Apr 2018
  • Time: 06:00 PM to 09:00 PM
  • All times are (GMT-06:00) US/Central
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  • Rock Valley College
  • 3301 North Mulford Road
  • Rockford, Illinois
  • United States 61114
  • Building: Woodward Tech Center
  • Room Number: WTC1322

  • Contact Event Host
  • Starts 16 April 2018 08:05 PM
  • Ends 26 April 2018 01:00 PM
  • All times are (GMT-06:00) US/Central
  • Admission fee ?
  • Menu: Vegetarian, Non-Vegetarian


  Speakers

Doug Smith Doug Smith

Topic:

Electrical Resonances in Physical Structures, A New Approach to Solving EMC Emissions and Immunity Problems

Many system design problems result from electrical resonances in the physical structures of the system, such as PCB construction and mounting, heat sink construction and mounting, chassis construction, unintended resonances of system antennas, and system cables both internal and external. If these problems are thought of in terms of resonances (LC and transmission lines), the problems are often more easily found and solved. Techniques for finding, characterizing, determining if a specific resonance is a problem or is harmless, and fixing those resonances that are causing problems are presented. The presentation is practical (as opposed to theoretical). Results are presented from various types of systems.

Outlin:

1. How to measure resonances

2. Examples of measurements and implications

3. Methods to kill the Q of resonances

4. Effect of system resonances on emissions and radiated immunity

5. Effect of system resonances on ESD performance

6. Testing resonances to see if they are a problem

7. Equipment recommendations

8. Summary

Biography:

Doug Smith received a B.E.E.E. degree from Vanderbilt University in 1969 and an M.S.E.E. degree from the California Institute of Technology in 1970. In 1970, he joined AT&T Bell Laboratories as a Member of Technical Staff. He retired in 1996 as a Distinguished Member of Technical Staff. From February 1996 to April 2000 he was Manager of EMC Development and Test at Auspex Systems in Santa Clara, CA. Mr. Smith currently is an independent consultant specializing in high frequency measurements, circuit/system design and verification, switching power supply noise and specifications, EMC, and immunity to transient noise. He is a Senior Member of the IEEE and a former member of the IEEE EMC Society Board of Directors.

His technical interests include high frequency effects in electronic circuits, including topics such as Electromagnetic Compatibility (EMC), Electrostatic Discharge (ESD), Electrical Fast Transients (EFT), and other forms of pulsed electromagnetic interference. He also has been involved with FCC Part 68 testing and design, telephone system analog and digital design, IC design, and computer simulation of circuits. He has been granted over 15 patents, several on measurement apparatus.

He is author of the book High Frequency Measurements and Noise in Electronic Circuits. His very popular website, http://emcesd.com (www.dsmith.org), draws many thousands of visitors each month to see over 250 technical articles as well as other features.