Functional Safety – A brief overview from DFT point of view
#Functional
#safety
#ISO
#26262
#Design-for-Test
Talk of Dr. Daniel Tille, Infineon Munich, Germany
Functional Safety is currently a very hot topic in the Automotive semiconductor community. Its fundamental purpose is to develop systems, that work correctly even in the presence of a fault. The international standard ISO 26262 gives instructions how the development of such a safe chip can be accomplished and how functional safety can be validated. The main goal of this presentation is to give some insights into this important topic. Furthermore, it is discussed how Design-for-Test usually contributes here during the development.
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- Linz, Oberosterreich
- Austria 4040
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Univ.-Prof. Dr. Robert Wille, Institut für Integrierte Schaltungen, robert.wille@jku.at