Very-Near-Field Solutions for Far-Field EMC Problems
#EMC
#testing;
#near-field;
#far-field;
#PCB
#emissions
Very-near-field measurements of radiated emissions are fast and easy to make and avoid the delays and the time consuming set-up of far-field measurements in a chamber. Very-near-field measurements allow EMC testing in less than one second! Using these techniques a designer can get an “emissions map†of a PCB or product in “real-time†to solve EMI and EMC problems early in the design cycle thus saving time and cost. In addition far-field prediction based on very-near-field measurements provide engineers with the world’s fastest pre-compliance verification. A demonstration of an actual “real-time†EMxpert will be shown.
Date and Time
Location
Hosts
Registration
-
Add Event to Calendar
- 161 Warren Street
- Newark, New Jersey
- United States 07102
- Building: NJIT (ECE)
- Room Number: ECE 202
- Click here for Map
- Contact Event Host
- Emad Farag, email enfarag@ieee.org
- Co-sponsored by NNJ IMS Chapter
- Starts 14 September 2013 10:00 PM UTC
- Ends 23 October 2013 08:00 PM UTC
- No Admission Charge
Speakers
Cedric Caudron of EMSCAN
Biography:
Cedric Caudron is an Application Engineer at EMSCAN with over 10 years of experience in RF design, EMC, Integrated Circuit and field support. He has been working with various well known companies such as STMicroelectronics, Intel and Sagem Defense Security across the UK, France, China, Canada and the United States.
Cedric holds a BEng Honors in Electrical and Electronics from the University of Wales in Cardiff UK and an M.Sc in Control Engineering from Coventry University.
Cedric Caudron of EMSCAN
Biography: