Power Device Reliability session at the 30th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis

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The Swiss Chapter of the IEEE Reliability society participates to the organization of the Power Device Reliability session at ESREF. In 2019, the Symposium tool place from September 23 to September 26, in Toulouse (France). The session included 10 oral presentations and 5 posters. All contributions have been published in a special issue of a journal.



  Date and Time

  Location

  Hosts

  Registration



  • Centre de congrès Pierre Baudis
  • 11, esplanade Compans Cafarelli
  • Toulose, Unknown
  • France 31685
  • Survey: Fill out the survey


  Speakers

Several speakers of ETH Zurich

Topic:

Power device reliability session at the 30th ESREF, Toulouse

10 speakers and 5 posters.

Chair M. Ciappa

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