Power Device Reliability session at the 30th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis

#Power #Device #reliability

The Swiss Chapter of the IEEE Reliability society participates to the organization of the Power Device Reliability session at ESREF. In 2019, the Symposium tool place from September 23 to September 26, in Toulouse (France). The session included 10 oral presentations and 5 posters. All contributions have been published in a special issue of a journal.

• Start time: 24 Sep 2019 08:15 AM
• End time: 25 Sep 2019 03:00 PM
• All times are (UTC+02:00) Bern
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• Centre de congrès Pierre Baudis
• 11, esplanade Compans Cafarelli
• Toulose, Unknown
• France 31685

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