Webinar - A New Ionizer Measurement Technology for ESD Class 0 Applications
Sponsor: IEEE Boston/Providence/New Hampshire Reliability Chapter
Please visit our website at www.ieee.org/bostonrel
Host: Dangelmayer Associates, L.L.C.
This webinar is presented as a courtesy to the IEEE Boston / Providence / New Hampshire Reliability Chapter and NE ESDA Chapter. It was originally scheduled as a joint meeting which was cancelled due the COVID-19 pandemic.
This presentation will center around a comparison of how a CPM (Charged Plate Monitor) historically has been used to calibrate Ionizers and how a new sensor views ionization performance, both in decay time as well as in Ion balance. This new sensor enables simultaneous measurement of these performance parameters.
The presentation will look at Ion Density, ion velocity and how those elements impact the elimination of static charge on surfaces. We are especially focused on low voltage impairments on surfaces and whether the CPM is actually providing the readings that will support the requirements on highly sensitive components. As device sensitivity continues to plummet, these indicators will become increasingly important.
Settling time will also be covered, and how this impacts readings, and what parameters impact the accuracy of the CPM. How settling time affects the time it takes for accurate measurements. We’ll also review feedback mechanisms in ionizers and the accuracy of those systems and review the future solutions for assessing compliance with eliminating low static charge environments.
Date and Time
Location
Hosts
Registration
- Date: 29 Apr 2020
- Time: 11:00 AM to 12:00 PM
- All times are (GMT-05:00) US/Eastern
- Add Event to Calendar
- Contact Event Host
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Michael W. Bannan, Chair
Boston/Providence/New Hampshire Reliability Chapter
- Co-sponsored by ESDA
Speakers
John Glynn II of NRD, LLC
A New Ionizer Measurement Technology for ESD Class 0 Applications
This presentation will center around a comparison of how a CPM (Charged Plate Monitor) historically has been used to calibrate Ionizers and how a new sensor views ionization performance, both in decay time as well as in Ion balance. This new sensor enables simultaneous measurement of these performance parameters.
The presentation will look at Ion Density, ion velocity and how those elements impact the elimination of static charge on surfaces. We are especially focused on low voltage impairments on surfaces and whether the CPM is actually providing the readings that will support the requirements on highly sensitive components. As device sensitivity continues to plummet, these indicators will become increasingly important.
Settling time will also be covered, and how this impacts readings, and what parameters impact the accuracy of the CPM. How settling time affects the time it takes for accurate measurements. We’ll also review feedback mechanisms in ionizers and the accuracy of those systems and review the future solutions for assessing compliance with eliminating low static charge environments.
Biography:
John Glynn II, Director of Sales, Marketing and Product Development NRD, LLC
Since joining NRD, LLC in 2016, John Glynn II, Director of Sales, Marketing and Product Development, has brought his technology and engineering knowledge to drive this leader of ionization solutions toward new innovative and profitable global solutions. As a senior leader, Mr. Glynn is utilizing his sales background, marketing insights, operational oversight, and product development under a single integrated organizational structure. John has proven success with identifying and understanding global markets and customer needs - whether adapting to current products or creating progressive product lines; developing multi-year strategic plans; then leading a unified, cross-functional team from sales, product design and operational processes toward efficient actionable delivery. His leadership with the soon-to-be released Ionmaster QMS™ product line will round out NRD’s alpha and corona products and enable NRD toward larger global expansion.
John Glynn II currently resides in Buffalo NY and Boston MA and graduated from Colby College.
Agenda
11:00AM Technical Presentation and Q&A
12:00PM Adjournment
The meeting is open to all. You do not need to belong to the IEEE to attend this event; however, we welcome your consideration of IEEE membership as a career enhancing technical affiliation.
There is no cost to register or attend, but registration is required.