MIL-STD-461G HIGHLIGHTS
IEEE Region 1 MTT/AP Chapter Co-sponsors the event
With the increased integration of embedded computing and wireless technologies into modern military systems, the need for mission success has put more emphasis on electromagnetic compatibility assurance.
This webinar will give an overview of the changes in place for the MIL-STD 461G test requirements and offer a historical perspective of the testing and how it has evolved to meet the modern challenges of defense electronics test and integration. Insight into the direction of future the continuing work of MIL-STDs will also be discussed.
Date and Time
Location
Hosts
Registration
-
Add Event to Calendar
- Virtual Online Meeting
- North Jersey, New Jersey
- United States
- Building: Virtual Online Meeting
- Room Number: https://webinars.on24.com/rohdeschwarzusa/milstd
- Contact Event Host
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Ajay Poddar, email: akpoddar@ieee.org
Mobile: +1(201) 560-3806
- Co-sponsored by IEEE R1 MTT/AP Chapter
- Starts 08 May 2020 02:00 PM UTC
- Ends 19 May 2020 04:00 PM UTC
- No Admission Charge
Speakers
Ken Javor
MIL-STD-461G HIGHLIGHTS
MIL-STD-461G HIGHLIGHTS
Biography:
Ken Javor has worked in the EMC industry for 40 years. He is a consultant to government and industry, runs a pre-compliance EMI test facility, and curates the Museum of EMC Antiquities, a collection of radios and instruments that were important in the development of the discipline, as well as a library of important documentation. Mr. Javor is an industry representative to the Tri-Service Working Groups that write MIL-STD-464 and MIL-STD-461. He has published numerous papers and is the author of a handbook on EMI requirements and test methods. Mr. Javor can be contacted at ken.javor@emccompliance.com.
Agenda
With the increased integration of embedded computing and wireless technologies into modern military systems, the need for mission success has put more emphasis on electromagnetic compatibility assurance.
This webinar will give an overview of the changes in place for the MIL-STD 461G test requirements and offer a historical perspective of the testing and how it has evolved to meet the modern challenges of defense electronics test and integration. Insight into the direction of future the continuing work of MIL-STDs will also be discussed.