Advanced mmWave Measurements

#EVM #MXA #PNA-X #VNA #EM #RF #5G #IoT #RFICs #MMICs
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IEEE North Jersey AP/MTT Chapter 

Presentation #1: Demodulate 5G NR Signals
30 Minutes

5G and wideband satellite applications require higher frequency and analysis bandwidth. The new wideband MXA is designed specifically to address this emerging market with a frequency range up to 50 GHz, an analysis bandwidth of 510 MHz, and superior phase noise performances. This demo shows how to demodulate wideband 5G NR signals along with a VXG signal generator.

Presentation #2: High-Performance mmWave EVM Measurements
30 Minutes

Overcome wideband EVM measurement challenges with improved accuracy using a VNA. We will present new simulation and measurement techniques through EVM measurement examples for components such as power amplifiers and mixers with newly developed DPD correction techniques for the highest performance stimulus signals. We will also introduce an additional platform in PXI for the multiport high-performance wideband EVM measurement.

Presentation #3: Wideband and Modulated Frequency Converter Test    
30 Minutes

5G and New-Space are technologies are converging in the mmWave implementations of these systems. Frequency converters are a key component used in these systems and, until now, testing these system components has been challenging due wide-bandwidths used, and the general difficulties of testing at mmWave frequencies. New hardware and software capabilities in the PNA-X address these challenges with improved measurement speed and quality. This webinar and demo will outline a variety of characterization methods, comparing swept frequency methods with modulated methods, as well as introduce some new test concepts such as source corrections using VNA methods applied to modulated signals.

 Please register for attebding the virtual webina sponsor by MTT-S:

https://www.keysight.com/us/en/events/america/tradeshows/virtual-mmwave-innovations.html


  Date and Time

  Location

  Hosts

  Registration


  • Add_To_Calendar_icon Add Event to Calendar
  • https://www.keysight.com/us/en/events/america/tradeshows/virtual-mmwave-innovations.html
  • North Jersey, New Jersey
  • United States
  • Building: Remote-Anywhere
  • Contact Event Host

  • Dr. Ajay Poddar:akpoddar@ieee.org

    Prof. Edip Niver

    Dr. Anisha Apte:anisha_apte@ieee.org

  • Co-sponsored by IEEE R1 MTT/AP Chapter
  • Starts 15 June 2020 04:00 PM UTC
  • Ends 25 June 2020 06:00 PM UTC
  • No Admission Charge

  Speakers

Sean Lee Sean Lee of Keysight Technologies

Biography:

 Sean Lee is currently a business development manager for signal analyzer and signal source products based in Santa Rosa, California.

Sean has a master's of science degree in engineering and has more than 11 years of marketing and business development experience in test and measurements as well as the semiconductor industry.

Speakers:

Mr. Sean Lee
Business Development Manager, Signal Analyzer and Signal Source
Keysight Technologies

Mr. Sam Kusano
Communications Solutions, Industry Expert
Keysight Technologies

Mr. Taku Hirato
Product Manager
Keysight Technologies

Mr. David Tanaka
Product Manager
Keysight Technologies

Mr. Joel Dunsmore
Keysight Fellow
Keysight Technologies

 

Address:Keysight Technologies, Business Development Manager, Signal Analyzer and Signal Source, United States, 91109-8099

Joel Dunsmore Joel Dunsmore of Keysight Technologies

Biography:

Since graduating from Oregon State University with an MSEE (1983), Joel Dunsmore has worked for Keysight Technologies (formerly Agilent and Hewlett-Packard) at the Santa Rosa Site. He received his Ph.D. from Leeds University in 2004. He is a Keysight R&D Fellow focused on component test. He was a principle contributor to the HP 8753 and PNA family of network analyzers, responsible for RF and Microwave circuit designs in these products. Recently, he has worked in non-linear test, including differential devices, and mixer measurements, as well as modulated and spectrum measurements. He has received 31 patents related to this work, and authored the “Handbook of Microwave Component Measurements”. He co-taught an RF course at the University of California, Berkeley, and presented several short courses and seminars through ARFTG, MTT and Keysight.

Speakers:

Mr. Sean Lee
Business Development Manager, Signal Analyzer and Signal Source
Keysight Technologies

Mr. Sam Kusano
Communications Solutions, Industry Expert
Keysight Technologies

Mr. Taku Hirato
Product Manager
Keysight Technologies

Mr. David Tanaka
Product Manager
Keysight Technologies

Mr. Joel Dunsmore
Keysight Fellow
Keysight Technologies

Address:Keysight Fellow , Keysight Technologies





Agenda

Join webinar on June 25, 2020 at 12:00 PM (EST-NY Time Zone)

You may log in 15 minutes prior.

Virtual Meeting: Participants can join from anywhere.

Please register for attebding the virtual webina sponsor by MTT-S and Keysight:

https://www.keysight.com/us/en/events/america/tradeshows/virtual-mmwave-innovations.html