IEEE IAS- Boston Technical Webinar: Risk Assessment & PPE for a post IEEE 1584-2018 world with a 1584 -2002 AF study

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IEEE IAS- Boston Technical Webinar :Risk Assessment & PPE for a post IEEE 1584-2018 world with a 1584 -2002 AF study

IEEE 1584 has been the definitive guide for Arc Flash calculations since its original publication in 2002. Today its impact on the electrical equipment industry would be difficult to exaggerate. The guide has been republished with significant changes to the model used for predicting incident energy, arcing current and the 1.2 calorie arc flash boundary. Rather than an evolutionary change, the new edition of this important IEEE guide is a revolutionary change in how we understand the science of estimating the severity of the arc flash hazard.  Consultants, users and workers need to understand the new model and what it says about the hazard posed by exposure to live electrical equipment. Many organizations have invested in arc flash studies over recent years whose results are now questionable. However, before the study can be updated tasks may need to be accomplished. The question may be, is the previously selected PPE still good enough? Marcelo will provide a method with which to answer this question based on a method described in an IEEE paper presented earlier this year at the IEEE Electrical Safety Workshop, “Considerations for Adapting IEEE 1584-2002 Arc Flash Study Results to a Post IEEE 1584-2018 Risk Assessment” By M.E. Valdes & H.L. Floyd.



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  • Date: 17 Dec 2020
  • Time: 12:00 PM to 02:00 PM
  • All times are (GMT-05:00) US/Eastern
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  • Boston, Massachusetts
  • United States

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  • Starts 17 November 2020 11:46 AM
  • Ends 17 December 2020 12:00 PM
  • All times are (GMT-05:00) US/Eastern
  • No Admission Charge


  Speakers

Marcelo Valdes, PE, IEEE Fellow

Topic:

IEEE IAS Boston Technical Webinar-Risk Assessment & PPE for a post IEEE 1584-2018 world with a 1584- 2002 AF study

IEEE 1584 has been the definitive guide for Arc Flash calculations since its original publication in 2002. Today its impact on the electrical equipment industry would be difficult to exaggerate. The guide has been republished with significant changes to the model used for predicting incident energy, arcing current and the 1.2 calorie arc flash boundary. Rather than an evolutionary change, the new edition of this important IEEE guide is a revolutionary change in how we understand the science of estimating the severity of the arc flash hazard.  Consultants, users and workers need to understand the new model and what it says about the hazard posed by exposure to live electrical equipment. Many organizations have invested in arc flash studies over recent years whose results are now questionable. However, before the study can be updated tasks may need to be accomplished. The question may be, is the previously selected PPE still good enough? Marcelo will provide a method with which to answer this question based on a method described in an IEEE paper presented earlier this year at the IEEE Electrical Safety Workshop, “Considerations for Adapting IEEE 1584-2002 Arc Flash Study Results to a Post IEEE 1584-2018 Risk Assessment” By M.E. Valdes & H.L. Floyd.

 

Biography:

Mr. Valdes was with GE over 41 years in various roles: Field engineering, equipment sales, application engineering, product management and standards. With ABB since 2018 he provides support in standards, application and product development for ABB.  Currently he participates in the NEC, CSA-Z462 and NFPA70B, as well as in various IEEE working groups, including IEEE 1584. He is active in various IEEE conferences such as IEEE Electrical Safety Workshop (ESW), PCIC, PPFIC, and I&CPS. He was chair of the 2014 IEEE ESW. He has won several awards from IEEE conferences for his contributions as well as several awards for some of his IEEE papers. He has published over 35 technical paper on various topics, mostly low voltage coordination and protection and holds 28 patents in related fields. Mr. Valdes holds an Electrical Engineering degree from Cornel University and is an IEEE Fellow

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