mmWave and sub-THz active load-pull, gain compression and S parameter measurements
IEEE North Jersey Section Co-sponsors the event
Measuring S-parameters has always been an accepted way to characterize these devices. As the devices start to be driven into the non-linear regions, standard S-Parameters are not enough for complete device characterization, and new techniques need to be used. In this webinar,
we will examine techniques that measure S-parameters at user-specified power levels, discuss making accurate and repeatable gain compression measurements, as well as non-50 ohm active load-pull measurements on DUTs under large-signal conditions which make validating non-linear device models possible, and how to create ideal matching networks to maximize DUT performance.
This Webinar will begin on Wednesday, March 24, 2021, 2:00 PM EDT (North America)
Duration: 1 hour 15 Minutes
For login information and password, please register by clicking the online link: REGISTRATION LINK
After completing the online registration, you will receive the Password in your Email ID.
Date and Time
Location
Hosts
Registration
- Date: 24 Mar 2021
- Time: 02:00 PM to 03:00 PM
- All times are (GMT-05:00) US/Eastern
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- Virtual Technical Webinar Meeting
- Virtual, New Jersey
- United States
- Building: Virtual
- Contact Event Hosts
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Ajay Poddar (akpoddar@ieee.org), Durga Misra (dmisra@njit.edu), Edip Niver (edip.niver@njit.edu), Anisha Apte (anisha_apte@ieee.org), Har Dayal (dayalhar@gmail.com); Ionel Bajescu (nelu108@yahoo.com)
- Co-sponsored by IEEE North Jersey Section
- Starts 10 March 2021 02:00 PM
- Ends 19 March 2021 03:00 PM
- All times are (GMT-05:00) US/Eastern
- No Admission Charge
Speakers
Joe Mallon of Rohde & Schwarz
mmWave and sub-THz active load-pull, gain compression and S parameter measurements
In recent years, there has been a substantial increase in the use of active devices operating at mmWave and sub-terahertz frequencies. Such devices find applications in various industries including automotive, radar, radio astronomy, remote sensing, military, and others.
Measuring S-parameters has always been an accepted way to characterize these devices. In this webinar, we will have a look at how VNAs are used to characterize these DUTs for linear frequency converting and non-frequency-converting applications.
As the devices start to be driven into the non-linear regions, standard S-Parameters are not enough for complete device characterization, and new techniques need to be used. We will examine techniques that measure S-parameters at user-specified power levels, discuss making accurate and repeatable gain compression measurements, as well as non-50 ohm active load-pull measurements on DUTs under large-signal conditions which make validating non-linear device models possible, and how to create ideal matching networks to maximize DUT performance.
This Webinar will begin on Wednesday, March 24, 2021, 2:00 PM EDT (North America)
Duration: 1 hour 15 Minutes
For login information and password, please register by clicking the online link: REGISTRATION LINK
After completing the online registration, you will receive the Password in your Email ID.
Biography:
Joe Mallon has over 25 years of experience working in the RF and Microwave industry on both the commercial wireless as well as the Aerospace and Defense markets. Throughout his career, he has held a variety of positions including Engineering, Sales, and Sales Management. Joe has held positions at Motorola, Lockheed Martin, Anaren Microwave, Crane Electronics, and Anritsu. In his current position at Rohde & Schwarz, he serves as a Business Development Manager for R&S’s line of Vector Network Analyzers. Joe holds a BSEE degree from Drexel University in Philadelphia, Pennsylvania.
Address:Rohde & Schwarz, , United States
Jonas Urbonas of CSA Group Bayern GmbH
mmWave and sub-THz active load-pull, gain compression and S parameter measurements
In recent years, there has been a substantial increase in the use of active devices operating at mmWave and sub-terahertz frequencies. Such devices find applications in various industries including automotive, radar, radio astronomy, remote sensing, military, and others.
Measuring S-parameters has always been an accepted way to characterize these devices. In this webinar, we will have a look at how VNAs are used to characterize these DUTs for linear frequency converting and non-frequency-converting applications.
As the devices start to be driven into the non-linear regions, standard S-Parameters are not enough for complete device characterization, and new techniques need to be used. We will examine techniques that measure S-parameters at user-specified power levels, discuss making accurate and repeatable gain compression measurements, as well as non-50 ohm active load-pull measurements on DUTs under large-signal conditions which make validating non-linear device models possible, and how to create ideal matching networks to maximize DUT performance.
This Webinar will begin on Wednesday, March 24, 2021, 2:00 PM EDT (North America)
Duration: 1 hour 15 Minutes
For login information and password, please register by clicking the online link: REGISTRATION LINK
After completing the online registration, you will receive the Password in your Email ID.
Biography:
Jonas Urbonas received the B.Eng and Ph.D. degrees in Electronic Engineering from the University of Surrey, Guildford, the United Kingdom in 2015 and 2019 respectively. He joined Maury Microwave Inc. in 2019 as a senior product engineer where he specializes in the development of new RF & Microwave device characterization solutions and their applications. Dr. Urbonas has published multiple peer-reviewed publications in various IEEE journals and is a member of the IEEE Microwave Theory and Techniques, Instrumentation and Measurement, Electron Devices, and Solid-State Circuits societies. In 2019, he was awarded The ARFTG Roger Pollard Student Fellowship in Microwave Measurements and won the best paper and best student paper awards at the 91st and 92nd ARFTG Microwave Measurement Conferences respectively.
Address:Maury Microwave Corporation,
Agenda
This Webinar will begin on Wednesday, March 24, 2021, 2:00 PM EDT (North America)
Duration: 1 hour 15 Minutes
For login information and password, please register by clicking the online link: REGISTRATION LINK
After completing the online registration, you will receive the Password in your Email ID.