Underexplored Three-Phase Power Failure Conditions - CEU/PDH Credit Available
In avionics, widely used standards for power quality include MIL-STD-704 and RTCA DO-160. While both these standards are extremely detailed, in the area of three-phase power failure, there are enhancements that should be considered to capture the full set of failure conditions that can occur in the field or during production tests.
For example, in MIL-STD-704, it is not clear how a phase loss is defined. Although the accompanying handbook (MIL-HDBK-704) does clarify the fault definition (as a zero-volt potential) it is also likely that the fault can be caused by an open-circuit condition, which is not covered. Also not covered is the application of power to the Unit Under Test (UUT) with a pre-existing fault condition. DO-160 has a similar issue with the phase fault definition, but it does cover some cases where the UUT is energized with a pre-existing fault. Neither specification covers the loss of the neutral connection for wye loads.
Suggested updates to both standards are discussed, along with examples describing scenarios where a UUT may pass the DO-160 and/or MIL-STD-704 phase loss methods but fail under conditions likely to occur in the field or during production test. Design mitigation techniques to prevent damage are also covered.
Date and Time
Location
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Registration
- Date: 26 May 2021
- Time: 06:00 PM to 07:00 PM
- All times are (UTC-04:00) Eastern Time (US & Canada)
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- Farmingdale, New York
- United States
- Starts 29 April 2021 12:28 PM
- Ends 26 May 2021 06:15 PM
- All times are (UTC-04:00) Eastern Time (US & Canada)
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Speakers
James Colotti of colotti@ieee.org
Underexplored Three-Phase Power Failure Conditions
Biography:
James Colotti is a Staff Engineer at Telephonics and is responsible for analog, RF and EMC hardware design in Air Traffic Control, Identification Friend/Foe and RADAR systems. He holds two patents: The Dual Threshold Amplitude Detector and the Synchronously Tuned Power Converter. Throughout his career, James has published several articles relating to analog/RF design. He is also a certified Electromagnetic Compatibility Engineer, by the National Association of Radio & Telecommunications Engineers. James received his BSEE from Polytechnic Institute of New York. He is a senior member of the IEEE and is currently serving as chair of the Circuits & Systems and EMC societies of the IEEE Long Island section.