Breaking Barriers in high speed Time & Frequency Domain Measurements

#Test #Techniques #Jitter #Oscilloscope #Spectrum #Analyzer
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This is a two part Seminar
Part 1: Serial Data Testing Techniques, by Frank Selvaggio
Abstract: During this part of the seminar we will review the different categories and types of jitter that can be found in everyday designs. We will dig into the origins and interrelationships of these, how they can be used to diagnosis, characterize and debug system hardware, and explain how these various jitter measurements are applicable to your specific applications. Also, we will discuss common pitfalls when making jitter measurements and how you can avoid them when making your measurements. Lastly, we will show how to use modeling tools to correlate simulations with high-speed physical layer measurements on Serial Bus Standards using cutting-edge oscilloscopes and software tools.
Part 2: Modern tools for Today’s Complex RF Applications, by Alan Wolke
Abstract: In this part of the seminar we will delve into how to utilize the latest techniques for tackling the most modern day RF design challenges in signal generation and analysis. Some of the design challenges which will be covered include: frequency agility, frequency hopping, multi-channel, low duty cycle bursty transmissions and complex and wideband modulations. Utilizing today's high speed arbitrary waveform generators can make it easy to create these complex RF scenarios. Analysis of these complex signals requires wide RF capture bandwidth, live RF visibility, flexible triggering, deep memory, and multi-domain time correlated analysis. Tools such as real-time spectrum analyzers and mixed domain oscilloscopes offer these capabilities to give you a complete understanding of the performance of your RF systems.


  Date and Time

  Location

  Hosts

  Registration



  • Add_To_Calendar_icon Add Event to Calendar
  • 400 Crossing Blvd.
  • 2nd Floor
  • Bridgewater, New Jersey
  • United States 08807
  • Building: China meeting room, Huawei (Futurewei) Technologies R&D Center
  • Click here for Map

  • Contact Event Host
  • Naresh Chand, (908) 723 7001, naresh.chand@huawei.com. Emad Farag, enfarag@ieee.org. Ajay Poddar, akpoddar@ieee.org (cell:201-560-3806) Russell Pepe, Russell.pepe@atm1.com.
  • Co-sponsored by Instrumentation and Measurement Society, Photonic Society and Microwave and Antenna Propagation Society Chapters of the IEEE North Jersey Section
  • Starts 17 July 2014 02:00 AM UTC
  • Ends 05 August 2014 08:00 PM UTC
  • No Admission Charge


  Speakers

Frank Selvaggio of Tektronix

Topic:

Serial Data Testing Techniques

During this part of the seminar we will review the different categories and types of jitter that can be found in everyday designs. We will dig into the origins and interrelationships of these, how they can be used to diagnosis, characterize and debug system hardware, and explain how these various jitter measurements are applicable to your specific applications. Also, we will discuss common pitfalls when making jitter measurements and how you can avoid them when making your measurements. Lastly, we will show how to use modeling tools to correlate simulations with high-speed physical layer measurements on Serial Bus Standards using cutting-edge oscilloscopes and software tools.

Biography: Frank Selvaggio is a Senior Field Applications Engineer at Tektronix Inc. with responsibility for supporting customers in Oscilloscope, Logic analyzer, Signal Source applications. Currently focusing on High Speed data links, Digital analysis (Bus and microprocessor debug & validation), TDNA Link analysis (Impedance, S-Parameters and Eye Simulation) and Optical data links. Specializing in standards compliance testing including DDR, SATA/SAS, USB, HDMI, Ethernet, PCI Express. Along with testing signal integrity methodologies for Jitter, BER, Link Analysis, Power supply and Protocol analysis. Has also specialized in designs for VXI and general GPIB ATE test systems. During the past 25 years at Tektronix Frank has helped 1000’s of companies in solving their design problems in a wide variety of applications.

Alan Wolke of Tektronix

Topic:

Modern tools for Today’s Complex RF Applications, by Alan Wolke

In this part of the seminar we will delve into how to utilize the latest techniques for tackling the most modern day RF design challenges in signal generation and analysis. Some of the design challenges which will be covered include: frequency agility, frequency hopping, multi-channel, low duty cycle bursty transmissions and complex and wideband modulations. Utilizing today's high speed arbitrary waveform generators can make it easy to create these complex RF scenarios. Analysis of these complex signals requires wide RF capture bandwidth, live RF visibility, flexible triggering, deep memory, and multi-domain time correlated analysis. Tools such as real-time spectrum analyzers and mixed domain oscilloscopes offer these capabilities to give you a complete understanding of the performance of your RF systems.

Biography: Alan Wolke is a Senior Field Applications Engineer serving customers in the northeastern corner of the U.S., focusing primarily on RF and high speed analog and mixed signal applications. He earned his BSEE in 1985 from NJIT and spent the majority of his career involved in various analog circuit design, test and application engineering roles before joining Tektronix in 2006. In his spare time, he is an active ham radio enthusiast (W2AEW) and enjoys tinkering in his home lab designing and building circuits, as well as debugging, repairing and restoring electronic equipment. You can check out Alan’s entry-level electronics and ham radio videos on his YouTube channel.


Frank Selvaggio of Tektronix

Topic:

Serial Data Testing Techniques

Biography:

Alan Wolke of Tektronix

Topic:

Modern tools for Today’s Complex RF Applications, by Alan Wolke

Biography: