Design Challenges in Phase Noise Measurement Architecture
IEEE North Jersey Section Co-sponsors the event
Phase noise is a complex and often counter-intuitive specification that can plague even the best RF design engineers, and had long been an overlooked part of the RF design process in need of innovation. Historically, long test times and complicated equipment set ups made phase noise testing cumbersome and costly to test. With a new architecture concept, a digital phase discriminator, the capabilities of phase noise testing have dramatically improved.
Building from a brief basic review of phase noise and how it can affect common RF systems, we will discuss the architecture and engineering trade-offs that went into the design of the R&S®FSWP Phase Noise Analyzer and VCO Tester. We will learn about how these trade-offs led to large improvements in speed, accuracy, and versatility while simplifying setup and measurements at the same time. Advantages in testing concepts like pulsed phase noise and pulse stability measurements will solve engineering challenges in Radar & EW systems.
- Date: Wednesday, July 14, 2021
Time: 1 PM (EDT)
Duration: 1 hour
For login information and password, please register by clicking the online link: Click to register
Date and Time
Location
Hosts
Registration
- Date: 14 Jul 2021
- Time: 12:00 PM to 01:00 PM
- All times are (GMT-05:00) US/Eastern
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- Virtual Technical Webinar Meeting
- Virtual, New Jersey
- United States
- Building: Virtual
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Ajay Poddar (akpoddar@ieee.org), Edip Niver (edip.niver@njit.edu), Anisha Apte (anisha_apte@ieee.org)
- Co-sponsored by IEEE North Jersey Section
Speakers
Kay Gheen of Rohde & Schwarz
Design Challenges in Phase Noise Measurement Architecture
Title: Design Challenges in Phase Noise Measurement Architecture
Date: Wednesday, July 14, 2021
Time: 1 PM (EDT)
Duration: 1 hour
For login information and password, please register by clicking the online link: Click to register
Biography:
Mr. Gheen spent the last nine years with Rohde & Schwarz (R&S) in aerospace & defense (AD) product planning for signal analyzers and signal generators. In this capacity, he is involved in developing requirements and specifications for new measurement instruments. For the past six years, he has primarily been focused on the R&S® FSWP phase noise analyzer. Prior to joining R&S, Mr. Gheen worked for Hewlett-Packard (HP) and Agilent Technologies since 1994 as a solution architect, developing custom measurement systems for satellite tests and the AD community. In 2000 HP became Agilent and Mr. Gheen worked as a factory-based applications engineer working on spectrum analyzer applications for AD customers. In addition, Mr. Gheen was the product planner for Agilent’s high-end phase noise measurement systems (E5500). Prior to joining HP Mr. Gheen worked as a program manager for a U.S. AD contractor developing radar and electronic warfare systems and special aircraft and satellite sensors used for MASINT (measurement and signatures intelligence) and ELINT.
Kay Gheen
Agenda
Title: Design Challenges in Phase Noise Measurement Architecture
Date: Wednesday, July 14, 2021
Time: 1 PM (EDT)
Duration: 1 hour
For login information and password, please register by clicking the online link: Click to register