Reliability in Terahertz Meaurement Systems for Dielectric Materials
#Terahertz
#Measurement
#Dielectric
#Materials
Dr. Jeff Seligman, Raytheon Missiles and Defense
Reliability Engineering concepts applied to Spectral Characterization of Dielectric Materials using Terahertz Measurement Systems
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- Date: 26 Oct 2021
- Time: 06:30 PM to 09:00 PM
- All times are (GMT-07:00) US/Arizona
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Alex Dely Cell 520-444-6490
Agenda
Reliability Engineering concepts applied to Spectral Charcaterization of Dielectric Materials using Terahertz Measurement Systems
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