Reliability in Terahertz Meaurement Systems for Dielectric Materials

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Dr. Jeff Seligman, Raytheon Missiles and Defense


Reliability Engineering concepts applied to Spectral Characterization of Dielectric Materials using Terahertz Measurement Systems



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  • Date: 26 Oct 2021
  • Time: 06:30 PM to 09:00 PM
  • All times are (GMT-07:00) US/Arizona
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  • Alex Dely Cell 520-444-6490







Agenda

Reliability Engineering concepts applied to Spectral Charcaterization of Dielectric Materials using Terahertz Measurement Systems



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