USB 3.2 Compliance Testing
IEEE North Jersey Section Chapter Co-sponsors MTT-S Webinar
This webinar is focused on topics related to USB technology, 3.2 compliance testing, signal integrity issues, and associated challenges. These include full and low-speed eye, back voltage, inrush current, spread spectrum clocking, jitter and eye, pre-shoot / de-emphasis, and many more. Practical examples and demonstrations illustrate USB compliance testing made easy and reliable.
Speakers: Pascal Berten, Senior Application Engineer, Eurofins Digital Testing and Johannes Ganzert, Application Engineer Oscilloscopes, Rohde & Schwarz
Date: Thursday, September 09, 2021
Date and Time
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- Date: 09 Sep 2021
- Time: 06:00 PM UTC to 07:00 PM UTC
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- Virtual
- Virtual, New Jersey
- United States
- Building: Remote-Anywhere
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Ajay Poddar (akpoddar@ieee.org), Durga Misra (dmisra@njit.edu), Edip Niver (edip.niver@njit.edu), AND Anisha Apte (anisha_apte@ieee.org)
- Co-sponsored by IEEE North Jersey Section MTT/AP Joint Chapter
Speakers
Johannes Ganzert
USB 3.2 Compliance Testing
Biography:
Johannes Ganzert is a Senior Applications Engineer for oscilloscopes at Rohde & Schwarz in Munich, Germany. After graduation from the Technical University of Munich, he joined Rohde & Schwarz as a Development Engineer for digital hardware and software. Over time, Johannes Ganzert acquired vast experience in RF and digital applications, particularly high-speed digital design and serial buses. He is an active participant in several standardization consortia such as the OPEN Alliance and USB-IF.
Pascal Berten
USB 3.2 Compliance Testing
Biography:
Pascal Berten is a Senior Test Engineer at Eurofins Digital Testing in Belgium. Encouraged by a solid background in Electronics-IT, he has more than 20 years of experience in certification testing for high-speed data standards and has witnessed all of the trends in the USB market. With his profound expertise in serial data communication and charging techniques, Pascal often gets invited as a keynote speaker to seminars to share his expertise. He has tested more than 1000 different types of products and was involved in the creation of test specifications.
IEEE MTT-S Webinar