Dr. Charles H. Recchia of M/A-COM Technology Solutions Inc.

This talk will present a correction to a widely used set of equations used to perform reliability estimation and quality sampling sample size determination. The new formulae are very easy to implement and result in considerable efficiency improvements for a given confidence level. As presented at the 2021 IEEE International Integrated Reliability Workshop conference, the former chi-squared based approach is supplanted by a gamma distribution using the Kerman neutral prior. We explain the origin of this correction and why the original formulae were faulty.

Design for Reliability is a discipline that refers to the process of designing reliability into products as part of the development process. If you are considering implementing a new DfR initiative or improving an existing program, join us to learn about what procedural steps and methods you may consider for your DfR process.

Biography:

Dr. Charles H Recchia, has held technology development, reliability engineering and director-level positions at Intel Corporation, MKS Instruments, Saint-Gobain, Raytheon Integrated Defense Systems and MACOM, having earned a Ph.D. in Experimental Solid State Physics from Ohio State University, an MBA from Babson College, with visiting academic appointments at Wittenberg University and Worcester Polytechnic Institute. He is author on 3 semiconductor technology patents, more than 20 peer-reviewed publications and has served on technical program committees for IEEE IRPS Conference and SELSE Workshops and chaired the IEEE/ASQ joint ASTR Conference. He has also conducted ASQ RD webinars on Bayesian methods in reliability engineering and serves as deputy editor for the international journal Reliability: Theory & Applications.  A Senior Member of IEEE and an elected IEEE Reliability Society Advisory Committee member, Dr. Recchia served a three-year extended term as IEEE Reliability Boston Chapter Chair from 2015-2017.