Mastering EVM: Optimizing to Industry Standards

#EVM #ACLR #VSG #5G
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IEEE North Jersey Section Co-sponsors the event

  • This webinar explores how to use EVM requirements to define the test instrumentation needs while making the most of the required budget.

  • For login information and password, please register by clicking the online link: REGISTRATION


  Date and Time

  Location

  Hosts

  Registration


  • Date: 05 May 2022
  • Time: 02:00 PM to 03:00 PM
  • All times are (GMT-05:00) US/Eastern
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  • Virtual Technical Webinar Meeting
  • Virtual, New Jersey
  • United States
  • Building: Virtual
  • Contact Event Hosts

  • Ajay Poddar (akpoddar@ieee.org), Edip Niver (edip.niver@njit.edu), Anisha Apte (anisha_apte@ieee.org), Durga Misra (dmisra@njit.edu), Har Dayal (dayalhar@gmail.com)

  • Co-sponsored by IEEE North Jersey Section

  Speakers

Martin Lim Martin Lim of Rohde & Schwarz

Topic:

Mastering EVM: Optimizing to Industry Standards

Most industry standards have EVM performance in their specification. Part four of our “Mastering EVM” webinar series looks at some of these standard’s specific parameters.  Some protocols can have quite a few parameters. For example, the 4G and 5G 3GPP standards have grown to become more and more “flexible”. Settings have grown from a dozen to now 100’s, making your test setup more complex. 802.11, or WiFi, has many settings as well. Wifi also allows for variable data lengths and channel bandwidths. Longer data lengths allow more time for the generator or analyzer to drift. The larger the bandwidth, the lower the signal-to-noise ratio (SNR). 802.11, LTE & 5G allow several channels to be broadcast at the same time. In 802.11 it is called channel bonding; in 4G & 5G, it is called carrier aggregation. Either way, the transmitter is sending more than one channel at a time. This will degrade our EVM. Be sure to characterize EVM with single-channel and carrier aggregation combinations. This webinar explores how to use your EVM requirements to define your test instrumentation needs while making the most of your budget.

Biography:

Martin Lim is a national application engineer with Rohde & Schwarz. He brings with him 22 years of semiconductor, wireless, and RF test experience. Currently focused on mmWave 5GNR physical layer testing. Past projects include 5GNR mmWave test system development; Envelope tracking; Amplifier (FEMiD) test; 802.11AC MIMO; Test Automation Speed & Radiated 5GNR. Prior to joining R&S, he served as RF Characterization Manager at Nokia Mobile Phones. Martin was responsible for cellular Tx/Rx, GPS, and 802.11 test systems development. He received his B.S. in Electrical Engineering from California Polytechnic, Pomona.

Address:Rohde & Schwarz, , United States

Johannes Ganzert of Rohde & Schwarz

Topic:

Testing HDMI 1.4b / 2.1 interfaces with oscilloscopes

Biography:

Johannes Ganzert is a Senior Applications Engineer for oscilloscopes at Rohde & Schwarz in Munich. After graduation from the Technical University of Munich, he joined R&S as a development engineer for digital hardware and software. Over time, Johannes Ganzert collected vast experience in RF and digital applications, particularly high-speed digital design and serial buses. He is an active participant in several standardization consortia like OPEN Alliance and USB-IF.





Agenda

For login information and password, please register by clicking the online link:  REGISTRATION