Mastering EVM: Optimizing your test setup

#EVM
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IEEE North Jersey Section Co-sponsors the event

  • This webinar is focused on how to optimize your test setup by evaluating both the generator and analyzer specifications, as well as how to test to ensure the performance you require. We will discuss what challenges to EVM measurement each standard introduces and how to select and optimize your signal generator and spectrum analyzer to achieve the bathtub curve performance needed for your design.

  • For login information and password, please register by clicking the online link: Registration


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  • Virtual Technical Webinar Meeting
  • Virtual, New Jersey
  • United States
  • Building: Virtual
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  • Ajay Poddar (akpoddar@ieee.org), Edip Niver (edip.niver@njit.edu), Anisha Apte (anisha_apte@ieee.org), Durga Misra (dmisra@njit.edu), Har Dayal (dayalhar@gmail.com)

  • Co-sponsored by IEEE North Jersey Section

  Speakers

Martin Lim Martin Lim of Rohde & Schwarz

Topic:

Mastering EVM: Optimizing Your Test Setup

Wireless standards for 5G FR1/FR2, WiFi 6/7, NewSpace, and future 6G standards are moving to higher frequencies, wider bandwidths, and/or more complex modulation schemes. Test engineers are upgrading their test equipment for R&D, characterization, and production. This webinar explores how to use your EVM requirements to define your test instrumentation needs while making the most of your budget.

Accurately measuring Error Vector Magnitude (EVM) has become a key specification for both the device under test and the test instrumentation as it encapsulates many RF parameters. With this one measurement, you can ensure noise floor, IQ modulation, phase noise, and amplitude error are within limits.

In this new webinar, we explore how to optimize your test setup by evaluating both the generator and analyzer specifications, as well as how to test to ensure the performance you require. We will discuss what challenges to EVM measurement each standard introduces and how to select and optimize your signal generator and spectrum analyzer to achieve the bathtub curve performance needed for your design.

Biography:

Martin Lim is a national application engineer with Rohde & Schwarz. He brings with him 22 years of semiconductor, wireless, and RF test experience. Currently focused on mmWave 5GNR physical layer testing. Past projects include 5GNR mmWave test system development; Envelope tracking; Amplifier (FEMiD) test; 802.11AC MIMO; Test Automation Speed & Radiated 5GNR. Prior to joining R&S, he served as RF Characterization Manager at Nokia Mobile Phones. Martin was responsible for cellular Tx/Rx, GPS, and 802.11 test systems development. He received his B.S. in Electrical Engineering from California Polytechnic, Pomona.

Address:Rohde & Schwarz, , United States




Agenda

  • For login information and password, please register by clicking the online link: Registration