Advanced eye analysis - get to your results faster

#5G #6G #Eye #Analysus
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IEEE North Jersey Section MTT/AP Chapter Co-Sponsors the event


This webinar is intended for engineers working on high-speed digital interface designs and testing.



  Date and Time

  Location

  Hosts

  Registration



  • Date: 08 Feb 2023
  • Time: 02:00 PM to 03:00 PM
  • All times are (GMT-05:00) US/Eastern
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  • Contact Event Host
  • Ajay Poddar (akpoddar@ieee.org), Edip Niver (edip.niver@njit.edu), Anisha Apte (anisha_apte@ieee.org)

  • Co-sponsored by IEEE North Jersey Section


  Speakers

Guido Schulze Guido Schulze of Rohde & Schwarz

Topic:

Advanced eye analysis - get to your results faster

This webinar is intended for engineers working on high-speed digital interface designs and testing.

This webinar will be starting with a short introduction to growing challenges on signal integrity such as increasing data rates, interference from increasing numbers of other sources, and transmitter timing effects. From an overview of dedicated tests for verification and debugging, we will get to eye diagram principles and traditional acquisition methods such as live eye and bit sequence. 

You will be learning the implemented hardware-based clock-data-recovery trigger functionality which approaches faster results for strong statistical confidence. Practical examples with the RTP oscilloscope will be illustrating advanced eye measurements made easy and reliable.

 

Biography:

Guido Schulze has more than 20 years of experience in high-speed digital testing. He has worked in the last ten years as a product manager for the oscilloscope product division of Rohde&Schwarz. He specializes in high-end models and their respective applications.

Address:Rohde & Schwarz, , Germany

Alessandro Cappelletti Alessandro Cappelletti of Rohde & Schwarz

Topic:

Advanced eye analysis - get to your results faster

This webinar is intended for engineers working on high-speed digital interface designs and testing.

Biography:

Alessandro obtained his MSc in Telecommunication Engineering and spent 10 years in the post-silicon validation field for the consumer electronics industry. At Rohde & Schwarz he is responsible for developing high-speed digital applications on high-end oscilloscopes with an emphasis on HDMI and MIPI technologies, focusing on measurement automation and compliance testing.

Address:Germany