USB 3.2 electrical compliance test
IEEE North Jersey Section Co-Sponsors the event
This webinar is intended for engineers who work on high-speed digital design and test.
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Ajay Poddar (akpoddar@ieee.org), Edip Niver (edip.niver@njit.edu), Durga Mishra (dmisra@njit.edu), (Anisha Apte (anisha_apte@ieee.org)
- Co-sponsored by IEEE North Jersey Section
Speakers
Johannes Ganzert of Rohde & Schwarz
USB 3.2 electrical compliance test
This webinar is intended for engineers who work on high-speed digital design and testing. In particular, we will be discussing the details of USB 3.2 Gen 1 and Gen 2 electrical compliance testing. The webinar will enable you to learn requirements and test setups of Rx receiver and Tx transmitter testing incl. spread spectrum clocking, jitter and eye, pre-shoot / de-emphasis, and many more. We will be talking about error sources when compliance fails and discussing the usage of tools that help to identify the root causes of the compliance failure. Practical examples and demonstrations illustrate USB 3.2 electrical compliance testing made easy and reliable.
Biography:
Johannes Ganzert is a Senior Applications Engineer for oscilloscopes at Rohde & Schwarz in Munich. After graduation at the Technical University Munich, he joined R&S as a development engineer for digital hardware and software. Over time, Johannes Ganzert collected a vast experience in RF and digital applications, particularly high-speed digital design and serial buses. He is an active participant in several standardization consortia like OPEN Alliance and USB-IF.
Address:Rohde & Schwarz, , Munich, Germany
Pascal Berten of Rohde & Schwarz
USB 3.2 electrical compliance test
This webinar will briefly discuss error sources when compliance fails and discuss the usage of tools that help to identify the root causes of the compliance failure. Practical examples and demonstrations illustrate USB 3.2 electrical compliance testing made easy and reliable.
Biography:
Pascal leads technical execution at GRL’s labs in Germany and Belgium. A world-recognized expert in USB testing, Pascal has deep technical expertise in signal integrity, protocol, and functional testing as well as power and cable design and test methodologies for multiple technologies including Ethernet, DisplayPort, MIPI, and HDMI. He has over 20 years of experience working closely with standards organizations such as the USB-IF, MIPI Alliance, and others to develop new specifications. Prior to joining GRL, Pascal spent over 20 years at Eurofins Digital Testing where he led testing, certification, interoperability, and troubleshooting efforts for a wide variety of products.
Address: Laboratory Director GRL EMEA Granite River Labs Inc, , United States