Technology Roadmap and On-Wafer Measurements
On-wafer measurements refer to the process of testing and analyzing electronic components, such as semiconductor devices, microchips, and integrated circuits, while they are still on the wafer substrate before being separated into individual devices. This technique allows for highly precise and efficient testing, as it eliminates the need to package and separate individual components for evaluation. On-wafer measurements involve using specialized equipment, such as probe stations and vector network analyzers, to assess the electrical characteristics, performance, and functionality of the devices. This testing method is critical in the semiconductor industry for quality control, process optimization, and developing advanced electronic components.
Date and Time
Location
Hosts
Registration
- Date: 04 Oct 2023
- Time: 12:00 PM to 01:30 PM
- All times are (UTC+05:30) Chennai
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- Conference Hall, ECE Department
- IIT Roorkee
- Roorkee, Uttaranchal
- India 247667
- Building: ECE Department
Speakers
Arunima Dasgupta of Global Foundries
Technology Roadmap and On-Wafer Measurements
Biography:
Arunima is a deputy director at Globalfoundries, working in the Design and Technology Enablement Organization. She is responsible for the worldwide characterization labs, which serve all GF customers with electrical data at device and circuit levels for both DC and RF platforms on all technologies within GF.
Arunima started her career in the semiconductor are in 2004 with IBM. She later joined GF in 2009 and has been involved in exciting projects from the start. She played a key role in the PDK team on the JDA alliance with IBM/Samsung/GF till 2012 and then moved to Malta to set up the device modeling lab in Malta. Once the alliance broke off with the integration of GF with IBM, she continued with her passion in the area of measurements and testing, being responsible for a global team, and now collaborates frequently with other labs around GF to always strive to provide the best quality data to our valued customers. She loves working with people and building teams that work together and is dedicated to the success of her people. Arunima has a master's degree in electrical engineering from George Mason University and has one patent and a few papers that she co-authored with her colleagues. She is excited to talk about the technology roadmap and measurements in GF.
Media
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