The use of 2D semiconductors as conducting channels in Field Effect Transistors (FETs) has been under research in the last years as an alternative to Si for nanoscale transistors. Besides, compared to graphene, they offer the advantage of having the semiconductor properties which allow them to be used as essential components in logic integrated circuits. The small thickness for 2D semiconductorsenables the ultimate scalability in FETs, due to a higher gate electrostatic controllability over the channel and compared to 3D gate structures it has less parasitic. To use those new devices in VLSI circuits, compact design-oriented models needed to be developed. We review the physics of different structures of 2D semiconductor FETs and methods to develop analytical equations of the I-V and C-V characteristics.

Biography:

Benjamin Iniguez obtained the Ph D in Physics in 1992 and 1996, respectively, from the Universitat de les Illes Balears (UIB). From February 1997 to September 1998 he was working as a Postdoctoral Researcher at the Rensselaer Polytecnhnic Institute in Troy (NY, USA). From September 1998 to January 2001 he was working as a Postdoctoral Scientist in the Université catholique de Louvain (Louvain-la-Neuve, Belgium), supported by two Marie Curie Fellowships from the European Commission. In February 2001 he joined the Department of Electronic, Electrical and Automatic Control Engineering (DEEEiA) of the Universitat Rovira i Virgili (URV), in Tarragona, Catalonia, Spain) as Titular Professor. In February 2010 he became Full Professor at URV. He obtained the Distinction from the Generalitat for the Promotion of University Research in 2004 and the ICREA Academia Award (the highest award for university professors in Catalonia, from ICREA Institute) in 2009 and 2014, for a period of 5 years each. He led one EU-funded project (“COMON”, 2008-12) devoted to the compact modeling of nanoscale semiconductor devices and he is currently leading one new EU-funded project (DOMINO, 2014-18) targeting the compact modeling of organic and oxide TFTs. His main research interests are the characterization, parameter extraction and compact modelling of emerging semiconductor devices, in particularorganic and oxide Thin-Film Transistors, nanoscale Multi-Gate MOSFETs and GaN HEMTs. He has published more than 150 research papers in international journals and more than 130 abstracts in proceedings of conferences.