Kimball Williams

Measurement system variability in a test laboratory can be a source of discomfort for the test engineer, the designer and management.  This is especially true in small development laboratories where there is a question of exactly what effect a design change had on system behavior.  The use of Statistical Process Control (SPC) methods to gage and track the variability of system measurements can provide confidence in the repeatability of the system setup, and in the data it produces. 

However, the use of SPC in an EMC Lab, especially for frequency domain measurements, requires decisions to limit the quantity of the data to avoid information overload.  To accomplish this careful selection of the measurement methods is essential.  

Biography:

Kimball Williams completed his career and retired from DENSO as a “Technical Fellow” in 2012 after 10 years managing its EMC Test Laboratory.  He is a certified Master EMC Design Engineer, EMC Test Engineer and ESD Test Engineer with Lifetime certification from iNARTE. 

He is an IEEE Senior Life Member and Past Chair of the IEEE Southeastern Michigan Section and an ‘Honored Member’ of the IEEE EMC Society where he serves as one of the Past Presidents Emeritus and current Director of Professional Activities. 

Kim is a licensed private pilot, PADDY certified scuba diver, licensed amateur radio operator (Call sign: N8FNC) and plays classical guitar in his ‘spare’ time.  

Email:

Address:Dearborn, Michigan, United States

Kimball Williams

Biography:

Email:

Address:Dearborn, Michigan, United States