Chemical Mechanical Polishing (CMP) for Hybrid Bonding
-- overview, planarization, forces, dishing, surface roughness, scratches, strategies ...
This talk provides a comprehensive overview of Chemical Mechanical Polishing (CMP) for Hybrid Bonding in semiconductor manufacturing. CMP is defined as a technique that combines chemical and mechanical forces to planarize films. The role of CMP in hybrid bonding (HB) is explored, emphasizing its significance in achieving controlled dishing and surface roughness. Key challenges in CMP for HB, such as scratches, dishing, and loading are addressed along with strategies for managing them. The talk concludes by emphasizing the importance of co-optimization of CMP for HB and its implications in semiconductor manufacturing and advanced packaging.
Date and Time
Location
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Registration
- Date: 25 Apr 2024
- Time: 12:00 PM to 01:00 PM
- All times are (UTC-07:00) Pacific Time (US & Canada)
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- Starts 29 March 2024 12:00 AM
- Ends 25 April 2024 12:00 AM
- All times are (UTC-07:00) Pacific Time (US & Canada)
- No Admission Charge
Speakers
Sameer Deshpande of Applied Materials
Biography:
Dr. Sameer Deshpande is Director of Product Marketing at Applied Materials’ CMP Business Unit. He received his PhD in Materials Science and Engineering in 2007 from the University of Central Florida (UCF) and has published over 20 papers and filed numerous patents. Currently, Dr. Deshpande focuses on developing products for Chemical Mechanical Planarization (CMP), aimed at 3D integration and wafer level packaging.