Fawnizu of University Technology Petronas

The electronics industry progresses at a very rapid rate, where the generations between product releases are becoming shorter. At the same time, the industry faces two difficult challenges. First, to improve user experience, the system needs to be more complex than ever. Second, to support the performance and power requirements, the basic component of an electronic circuit—the transistors—need to switch faster with lower power dissipation. This necessitates the development of smaller manufacturing capabilities beyond the current 10 nm technologies. The ITRS roadmap (2013 edition) envisions a 7nm technology by 2017 and 3.5 nm by 2021. As we progress into the very small feature sizes, the probability of defects increases tremendously, thus the circuit reliability decreases.

With this scenario, the research into circuit reliability and fault tolerance becomes more important. In this talk, the speaker will focus on the current technology trends, then focus on the topic of test and debug of a microprocessor system. The proposed system provides an avenue for an in-situ test and debug in the functional mode as well as the standard test mode. With this enhanced capability, it then becomes possible to embed other things on-chip such as targeted on-line testing, on-board fault tolerance and defect recovery, and real-time failure prediction.

Biography:

Dr. Fawnizu is an Associate Professor at the Electrical & Electronics Engineering Department, Universiti Teknologi Petronas, Malaysia. He is a member of the Centre for Intelligent Signal and Imaging Research. On the administrative side, Dr Fawnizu is the Director of UTP Strategic Alliance Office (Since Oct.2014). He was the Deputy Head of EE Department (2012-2013), Program Manager of the MSc in Electronics System Engineering, (2013-2014) a coursework-based Master program offered by the Electrical & Electronics Engineering Department at UTP.
Dr Fawnizu received the Bachelor of Electrical Engineering degree with emphasis in the field of Computer Design from the University of Minnesota, Twin Cities in 1999. Upon completion, he returned to Malaysia to join the Universiti Teknologi Petronas as a tutor. 
Early in 2000, he continued his study at the University of New South Wales, Australia and obtained the Masters of Engineering Science in Electrical Engineering in 2001. He returned to Universiti Teknologi Petronas to join as an academic staff where he pursued his interest in academic and research until the end of March 2005. Starting April 2005, Dr Fawnizu continued his research as a PhD student at the Nara Institute of Science and Technology, Japan. He was awarded the Monbukagakusho scholarship for the duration of his PhD research by the Ministry of Education, Culture, Sports, Science and Technology (MEXT) of Japan. 
At Nara Institute, he completed his PhD atthe Computer Design & Test Laboratory (Fujiwara Laboratory). His PhD thesis is in the field of System-on-Chip and Network-on-Chip Testing under the supervision of Professor Hideo Fujiwara and Assistant Professor Tomokazu Yoneda. He has published several research papers as a result of his research at the laboratory. 

Email:

Address:University Technology Petrona, , penang, Malaysia

Rajaram of CASEST, University of Hyderabad

The talk describes various research topics on which high end research is being conducted in are of nanoelectroincs, Micro fluidics, nano fibres, etc. 

Biography:

Prof. Rajaram is a Professor at at CASEST in the School of Physics, University of Hyderabad, which he joined in 1986. He obtained his Ph. D. in Physics from the Tata Institute of Fundamental Research, Mumbai. Dr Rajaram’s current research interests include Semiconductor Physics, Sensor- and Device- Microfabrication for optical and electronic applications. He has earlier worked on magnetic materials. His recent work include GaAs-based Hall Effect magnetic field sensors based on GaAs/AlGaAs multilayer structures with the 2DEG layer for applications in Physics and Non-Destructive Testing by flux leakage measurements. Current and future work relates to building on-chip support circuits for these sensors using HEMTs and, eventually, MMICs and all-electronic Terrahertz circuits. Recent results throw light on processing issues related to this integrationprincipally the role of Ni in Ohmic contact formation. Work on nanostructure Photonic Band Gap devices are also in progress. He is also interested in Solar Energy studies.

Email:

Address:MJCET, Road No 3, Banjara Hills,, Vice Chair, IEEE CASS Hyderabad Section, Hyderabad, India, 500034