Boston SMTA/iMAPs/IEEE Boston/New Hampshire/Providence Joint Reliability Chapter Event: "Multiscale Manufacturing-Inspection and Failure Analysis Methods for Electronics"

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   Multiscale Manufacturing-Inspection and Failure Analysis Methods for Electronics


Overview:

Multiscale Manufacturing-Inspection and Failure Analysis Methods for Electronics
 
This meeting will cover laboratory techniques and test methods for a variety of samples from components to PCBA’s and whole commercial devices. A number of familiar analytical techniques will be discussed and demonstrated related to reliability and process inspection, including visual inspection and standard techniques like Ball Shear, X-ray Imaging, CSAM and other standard composite methods. Additionally, more specialized approaches to Failure Analysis, research, and process development will be demonstrated including use of multiple types of electron microscopes, spectroscopy, and Focused Ion Beam analysis for 3D examination of devices on a nano-scale.  
 
Advanced MicroAnalytical is part of the EMSL Analytical network.  Coming up on 10 years this May, Advanced MicroAnalytical has been delivering in-depth scientific support for a wide range of industries and sample types.  Our staff and analytical capabilities are primed to provide leading edge support for industries including, including manufacturing, micro-electronics, nano-fabrication, aerospace and defense, medical devices and more. This meeting will demonstrate the type of work flow associated with finding and understanding problems that challenge attending members – from initial product development choices, through reliability, product support, and customer facing FA efforts. Advanced MicroAnalytical is located in the hub of technology on the East Coast just north of Boston, MA, in Salem NH.

Cost:
Members: $25
Non-members: $30
Students/Retired: $10

IEEE and iMAPs Members please contact Mike Jansen mjansen@macktech.com to receive promo code for discounted rate

If you are not an SMTA member, you may click "Continue as Guest" on the registration page.



  Date and Time

  Location

  Hosts

  Registration



  • Date: 23 Apr 2024
  • Time: 05:30 PM to 09:00 PM
  • All times are (GMT-05:00) US/Eastern
  • Add_To_Calendar_icon Add Event to Calendar
  • Advanced MicroAnalytical
  • 50A Northwestern Drive
  • Salem, New Hampshire
  • United States 03079
  • Building: Unit #4

  • Contact Event Host
  • Mike Jansen
    978-987-3716

  • Co-sponsored by Boston SMTA and iMAPs


  Speakers

Jared Kelly

Topic:

Multiscale Manufacturing-Inspection and Failure Analysis Methods for Electronics

This meeting will cover laboratory techniques and test methods for a variety of samples from components to PCBA’s and whole commercial devices. A number of familiar analytical techniques will be discussed and demonstrated related to reliability and process inspection, including visual inspection and standard techniques like Ball Shear, X-ray Imaging, CSAM and other standard composite methods. Additionally, more specialized approaches to Failure Analysis, research, and process development will be demonstrated including use of multiple types of electron microscopes, spectroscopy, and Focused Ion Beam analysis for 3D examination of devices on a nano-scale.  
 
Advanced MicroAnalytical is part of the EMSL Analytical network.  Coming up on 10 years this May, Advanced MicroAnalytical has been delivering in-depth scientific support for a wide range of industries and sample types.  Our staff and analytical capabilities are primed to provide leading edge support for industries including, including manufacturing, micro-electronics, nano-fabrication, aerospace and defense, medical devices and more. This meeting will demonstrate the type of work flow associated with finding and understanding problems that challenge attending members – from initial product development choices, through reliability, product support, and customer facing FA efforts. Advanced MicroAnalytical is located in the hub of technology on the East Coast just north of Boston, MA, in Salem NH.

Biography:

Jared Kelly has been working in laboratories for 30 years, come this spring. Initially focused on learning organic and biochemistry at Yale, working in a testing lab part time exposed him to using microscopy to support those testing methods. Impressed with the breadth and depth of information available with a scanning electron microscope. Shifting focus to research on time resolved spectroscopy, working with an electron microscope has been a part of Jared’s career ever since. Jared has worked at and been lab manager at a number of laboratories around the Northeast, including STL (Now Eurofins/TestAmerica), MicroVision Labs, and now Advanced MicroAnalytical. Over these decades, developing custom analysis methodology to serve client’s needs in novel ways using a wide range of different methods has been a passion, and allowed for continual development across several companies. Starting Advanced MicroAnalytical as a branch of EMSL Analytical ten years ago, serving as Lab Manager has allowed the depth of services offered to grow and develop. Now, the facility holds a wide range of analysis methodology, allowing for analysis of structure and composition on samples from a meter to a nanometer all in one facility. Jared looks forwards to many years continuing to expand in experience and service to our clientele. 

Address:New Hampshire, United States

Chuck Lemieux

Topic:

Multiscale Manufacturing-Inspection and Failure Analysis Methods for Electronics

This meeting will cover laboratory techniques and test methods for a variety of samples from components to PCBA’s and whole commercial devices. A number of familiar analytical techniques will be discussed and demonstrated related to reliability and process inspection, including visual inspection and standard techniques like Ball Shear, X-ray Imaging, CSAM and other standard composite methods. Additionally, more specialized approaches to Failure Analysis, research, and process development will be demonstrated including use of multiple types of electron microscopes, spectroscopy, and Focused Ion Beam analysis for 3D examination of devices on a nano-scale.  
 
Advanced MicroAnalytical is part of the EMSL Analytical network.  Coming up on 10 years this May, Advanced MicroAnalytical has been delivering in-depth scientific support for a wide range of industries and sample types.  Our staff and analytical capabilities are primed to provide leading edge support for industries including, including manufacturing, micro-electronics, nano-fabrication, aerospace and defense, medical devices and more. This meeting will demonstrate the type of work flow associated with finding and understanding problems that challenge attending members – from initial product development choices, through reliability, product support, and customer facing FA efforts. Advanced MicroAnalytical is located in the hub of technology on the East Coast just north of Boston, MA, in Salem NH.

Biography:

Chuck Lemieux is the Assistant Lab Manager for Advanced MicroAnalytical a division of EMSL. Chuck has worked in the Electronics industry, specifically with components and PCB’s, for more than 35 years, and enjoys working on the ever changing analysis we see. Chuck has had training in soldering and CSAM techniques and the operations of various analytical instruments. Chuck has also successfully traversed the mired down and often redundant world of military/DOD specifications in regards to DPA testing. Outside of the analytical world, Chuck is an active member of the United Sates Bowling Congress community at the league, state and national levels. Chuck is also as a Certified Bronze level coach and coaches a local high school team.






Agenda

5:30 PM - Registration
6:00 PM - Dinner
6:30 PM - Presentation
7:30 PM - Tour 
9:00 PM - Adjourn