Prof Albert Wang of University of California, Riverside

On-chip ESD protection design remains one major IC reliability challenge, particularly for high-speed, high-frequency ICs. This lecture discusses ESD protection designs for RF ICs. The lecture will cover ESD fundamentals, ESD Design Overhead Effect, ESD Design Window, mixed-mode ESD protection design technique, RF ESD designs and characterization, ESD-RFIC co-design methodology to mmWave, etc. The discussion will be supported by many practical ESD protection design examples.

Biography:

Albert Wang received the BS degree from Tsinghua University and the PhD degree from State University of New York at Buffalo. He is a Professor of Electrical and Computer Engineering at University of California, Riverside, USA. His research covers semiconductor devices, AMX/RF ICs, design-for-reliability for ICs, 3D heterogeneous integration, emerging devices and circuits, and LED visible light communications. He published two books and 320+ peer-reviewed papers, and holds 16 U.S. patents. His editorial board services include IEEE TCAS I, IEEE EDL, IEEE TCAS II, IEEE TED, IEEE JSSC, and IEEE TDMR. He is/was IEEE Distinguished Lecturer for IEEE EDS/CASS/SSCS. He was President of IEEE Electron Devices Society. His other committee services include the International Technology Roadmap for Semiconductor (ITRS), IEEE Heterogeneous Integration Roadmap (HIR), IEEE 5G Initiatives, IEEE Smart Lighting Project Roadmap and IEEE Fellow Committee. He was General Chair of IEEE EDTM2021 and IEEE RFIC2016. He was Program Director of National Science Foundation, USA. He was recipient IEEE J. J. Ebers Award and IEEE EDS Distinguished Service Award. Wang is a Fellow of National Academy of Inventors, an IEEE Fellow and an AAAS Fellow.

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