Careers in Technology Summer Series 2024 - Lou Gullo - Reliability Engineering /Technology
This session on reliability engineering/technology will focus on reliability engineering as an engineering discipline and profession that is critical for today's complex and critical systems, and reliability technology as a constantly evolving technology in electrical/electronic/mechanical system design and development. This session will also focus on the history of IEEE reliability standards and the latest standards being developed by IEEE to move reliability engineering and technology further. Examples of IEEE reliability standards will be provided. Also, excerpts from my first book, Design for Reliability (DfR), by Raheja and Gullo, will be provided.
Date and Time
Location
Hosts
Registration
- Date: 16 Jul 2024
- Time: 07:00 PM to 08:00 PM
- All times are (UTC-05:00) Central Time (US & Canada)
- Add Event to Calendar
- Starts 10 June 2024 12:00 AM
- Ends 16 July 2024 12:00 AM
- All times are (UTC-05:00) Central Time (US & Canada)
- No Admission Charge
Speakers
Lou of IEEE Reliability Society
Reliability Engineering/Technology
This session on reliability engineering/technology will focus on reliability engineering as an engineering discipline and profession that is critical for today's complex and critical systems, and reliability technology as a constantly evolving technology in electrical/electronic/mechanical system design and development. This session will also focus on the history of IEEE reliability standards and the latest standards being developed by IEEE to move reliability engineering and technology further. Examples of IEEE reliability standards will be provided. Also, excerpts from my first book, Design for Reliability (DfR), by Raheja and Gullo, will be provided.
Biography:
Over 40 years of experience in system, hardware, and software reliability, maintainability, testability, prognostics, safety, security, and fault management for the military, space, telecom, and commercial electronics industries. Awarded a US Patent in January 2004 for Reliability Assessment Program (RAP). Editor/author of 3 books.
Address:United States