2017 IEEE EMC Milwaukee Section Seminar

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2017 is our 16th year in offering an IEEE EMC Seminar. This year’s program is focused on “Global Market Access” and the Hidden Challenges within the phases of Product Development. This Seminar brings together two Global Experts that understand this Challenge.

Elya Joffe is past President of both the IEEE EMC Society and the IEEE Product Safety Engineering Society. He has Lectured and Consulted Globally addressing both applications.

Mark Maynard is current President of the IEEE Product Safety Engineering Society and has extensive experience with Global Certifications, including Wireless Certifications.

Join us, seating is limited. Our Goal of providing an EMC Seminar that is Local, Affordable and Providing the Highest Level of Educational Value is again accomplished with Elya Joffe and Mark Maynard.


  Date and Time

  Location

  Hosts

  Registration


  • Date: 14 Mar 2017
  • Time: 07:30 AM to 06:30 PM
  • All times are (GMT-06:00) US/Central
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  • 6401 South 13th Street
  • Milwaukee, Wisconsin
  • United States 53221
  • Building: Crowne Plaza Hotel-Milwaukee Airport
  • Click here for Map
  • Contact Event Host

  • Jim Blaha- EMC Chapter Chair: James.Blaha@ul.com

    Tom Smith- EMC Chapter Vice-Chair: tom.smith@lairdtech.com

  • Starts 09 January 2017 10:00 AM
  • Ends 13 March 2017 03:00 PM
  • All times are (GMT-06:00) US/Central
  • Admission fee ?




Agenda

7:30 – 8:20am      Registration and Continental Breakfast

8:20 – 8:30am      Welcome and Introductions

8:30 – 10:00am    1st Technical Session- Mr. Mark Maynard
                              What is Global Market Access?
                              Where does EMC fit in with Product Safety?
                              Product Markings, DOC’s, Directives …
                              IoT – What is IoT? How is it Regulated? and Who is Responsible?

10:00 – 10:30am   Morning Refreshment Break Exhibitors Display and Demonstrations

10:30 – 12:00pm   2nd Technical Session- Mr. Elya Joffe
                              The Challenges in Ultra-High Speed PCB
                              Design for EMC and Signal Integrity
                              High-speed channel characterization / modeling 3D IC and 3D packaging Measurement Techniques

12:00 – 1:00pm     Lunch with the Exhibitors and IEEE Acknowledgments

1:00 – 2:30pm       3rd Technical Session- Mr. Elya Joffe
                              How to Fail EMC in 10 Easy Lessons
                              Take Home Review Sheet to keep Posted in your office.

2:30 – 3:00pm       Afternoon Refreshment Break Exhibitors Display and Demonstrations

3:00 – 3:15pm       IEEE Recognition Awards

3:15 – 4:45pm       4th Technical Session- Mr. Mark Maynard
                              Wireless Global Market Access
                              Wireless Access – Government Controlled
                              FCC Certification vs. the World
                              How to Design for Wireless GMA

4:45 – 4:50pm       Mr. Jim Blaha
                              Closing Comments and Seminar Survey

4:50 – 5:45pm       Post Seminar Social with Exhibitors