CTSoC local chapter 20 years anniversary celebration event
2024 marks the 20-year anniversary of Consumer Technology Society Silicon Valley Chapter and I would like to invite you to join us for a celebration event.
For this purpose, we would like to invite you to a lunch event on December 8th at the Plug-n-Play Center, located at 440 N Wolfe Rd, Sunnyvale, CA 94085.
After lunch, we are honored to have Larry Dworkin, Marketing Director of ASML Metrology and Inspection Group, give us a presentation on SEM Scanning Electron Microscope.
This is an in-person event and I look forward to seeing you on Dec 8.
This event is cohost with YP and LM local chapter.
Date and Time
Location
Hosts
Registration
- Date: 08 Dec 2024
- Time: 11:30 AM to 03:00 PM
- All times are (UTC-08:00) Pacific Time (US & Canada)
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- 440 N Wolfe Road
- Sunnyvale, California
- United States 94085
- Building: Plug-N-Play Center
- Contact Event Hosts
- Co-sponsored by CH06074 - Santa Clara Valley Section Chapter, SP01
- Starts 13 November 2024 12:00 AM
- Ends 08 December 2024 12:00 AM
- All times are (UTC-08:00) Pacific Time (US & Canada)
- Admission fee ?
Speakers
Larry Dworkin of ASML US
The Use of Scanning Electron Microscopes in Semiconductor Manufacturing
Electron microscopes are used in several places by semiconductor device manufacturers. They can be used to identify locations of physical and electrical failures, measure critical dimensions and placement error, and be used to perform failure analysis of defects.
This talk will present an introduction to Scanning Electron Microscopes (SEM) including the key components needed in order to generate a high quality SEM image. It will also cover use cases in the semiconductor industry where high speed acquisition and analysis of nanometer size structures is needed in order to ensure devices perform as specified to meet yield targets.
Biography:
Director of product marketing, e-beam metrology products @ ASML
For over 25 years Larry has worked on applications and marketing of electron microscopes for use in the semiconductor industry. He began his career at Applied Materials as an applications engineer working on Scanning Electron Microscopes (SEM) for Defect Review and the measurement of Critical Dimensions (CD).
From there he spent nearly 20 years at Thermo Fisher Scientific (previously FEI Company) identifying use cases and creating product requirements for Focused Ion Beams (FIB) & SEM Wafer DualBeam products as well as Transmission Electron Microscopes (TEM) for the semiconductor market.
He joined ASML 3 years ago working in product marketing and management on massive metrology SEMs for measuring CDs and Edge Placement Error (EPE).
He holds a Masters of Science in Physics from UCLA.
Address:80 W Tasman Dr, , San Jose, United States, 95134
Agenda
11:30AM open + networking
11:50AM lunch delivery
12 - 12:45PM lunch + clean up
1 - 2PM presentation + Q&A
2 - 2:30PM pass and current officer speech, recognition and 2025 outlook
2:30 - 3PM network and close down