Uncovering hidden signal anomalies with high resolution oscilloscopes
IEEE North Jersey Section Co-Sponsors the TALK: "Uncovering hidden signal anomalies with high-resolution oscilloscopes"
This webinar reveals how high-resolution oscilloscopes are revolutionizing the debugging of modern electronics. Participants will delve into the constraints of conventional ENOB (Effective Number of Bits) and understand the importance of higher resolution for precise analysis in sophisticated systems. Our specialist will illustrate how digital triggering, rapid acquisition, and zone triggers across time and frequency domains are instrumental in identifying and addressing intricate waveform and conducted emission challenges. Through real-world measurement scenarios, we will demonstrate how these tools can detect elusive issues in power electronics systems and provide more accurate performance insights.
In this session, the following topics will be discussed:
- How high-resolution oscilloscopes overcome the shortcomings of traditional ENOB in measurements
- The vital importance of digital triggering and zone triggers in pinpointing complex waveform problems
- The advantages of swift acquisition for detailed diagnostics in both time and frequency domains
- Real-case applications for isolating interference and emissions in power systems using spectral zone triggers and conducted emission analysis.
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Ajay Poddar (akpoddar@ieee.org), Edip Niver (edip.niver@njit.edu), Durga Mishra (dmisra@njit.edu), (Anisha Apte (anisha_apte@ieee.org)
- Co-sponsored by IEEE North Jersey Section
Speakers
Chun Soong Wong of Rohde & Schwarz
Uncovering hidden signal anomalies with high resolution oscilloscopes
This webinar will demonstrate how high-resolution oscilloscopes are transforming the debugging process for modern electronics. Participants will explore the limitations of the traditional Effective Number of Bits (ENOB) and learn about the significance of higher resolution for accurate analysis in complex systems. Our specialist will explain how digital triggering, rapid acquisition, and zone triggers in both time and frequency domains are essential for identifying and resolving intricate waveform and conducted emission issues. Through real-world measurement examples, we will showcase how these tools can uncover elusive problems in power electronics systems and provide more precise performance insights. During this session, we will cover the following topics:
- How high-resolution oscilloscopes address the limitations of traditional ENOB in measurements
- The critical role of digital triggering and zone triggers in identifying complex waveform issues
- The benefits of rapid acquisition for detailed diagnostics in both time and frequency domains
- Practical applications for isolating interference and emissions in power systems using spectral zone triggers and conducted emission analysis.
Biography:
CS Wong has over 20 years of experience in test and measurement. He is currently a product manager for Rohde & Schwarz, focusing on mid-range oscilloscopes designed for power electronics applications. In his early career at Intel, he worked on chipset electrical validation, where he developed measurement methodologies for USB, DDR, and DisplayPort. He later transitioned to platform application, collaborating closely with original design manufacturers (ODMs) and original equipment manufacturers (OEMs) on motherboard design.
Address:Rohde & Schwarz,
Mike Schnecker of Rohde & Schwarz
Uncovering hidden signal anomalies with high resolution oscilloscopes
This webinar will will cover the following topics:
- How high-resolution oscilloscopes address the limitations of traditional ENOB in measurements
- The critical role of digital triggering and zone triggers in identifying complex waveform issues
- The benefits of rapid acquisition for detailed diagnostics in both time and frequency domains
- Practical applications for isolating interference and emissions in power systems using spectral zone triggers and conducted emission analysis.
Biography:
Mike Schnecker is the Business Development Manager at Rohde & Schwarz. He holds a Bachelor of Science degree from Lehigh University and a Master of Science degree from Georgia Tech, both in electrical engineering. With extensive experience in the test and measurement industry, he has worked in applications, sales, and product development, specializing in signal integrity applications using oscilloscopes and other instruments. Before joining Rohde & Schwarz, Mr. Schnecker held positions at LeCroy and Tektronix. While at LeCroy, he was responsible for deploying the SDA series of serial data analyzers.
Address:United States