MAGIC: Malicious AGing In Circuits/Cores

#EDS #Baltimore #Spring #2017 #Design #for #Trust #Reliability #MAGIC #Malicious #Aging
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The Baltimore Chapter of Electron Devices and Solid-State Circuits will hold their Spring Meeting on April 25, 2017.  We are pleased to host Dr. Naghmeh Karimi from the UMBC Department of Computer Science and Electrical Engineering, who will discuss malicious aging in integrated circuits.  This free event will be held at our normal meeting site at the National Electronics Museum near the BWI airport.  Complimentary refreshments will be provided beginning at 5:30 PM.  Seminar begins at 6:15 PM.  Please register on this site or contact the meeting organizer at papotyraj@ieee.org.


  Date and Time

  Location

  Hosts

  Registration


  • Date: 25 Apr 2017
  • Time: 09:30 PM UTC to 11:30 PM UTC
  • Add_To_Calendar_icon Add Event to Calendar
  • 1745 W. Nursery Road
  • Linthicum, Maryland
  • United States 21090
  • Building: National Electronics Museum
  • Room Number: Pioneer Hall
  • Click here for Map
  • Contact Event Host

  • Dr. Paul Potyraj, Secretary and Chair

  • Starts 04 April 2017 04:00 AM UTC
  • Ends 25 April 2017 03:59 AM UTC
  • No Admission Charge

  Speakers

Dr. Naghmeh Karimi Dr. Naghmeh Karimi of UMBC

Topic:

Malicious AGing In Circuits/Cores

The circuitry comprising an IC degrades over its lifetime, ultimately resulting in IC failure.  While IC designers put a tremendous effort into reducing aging effects and enhancing the reliability of electronic chips, adversaries may aim at accelerating the wearout of these chips.  In practice, a malicious adversary may accelerate the aging process of an IC and thus shorten the device’s life span.


This talk explores the security vulnerability of modern microprocessors against aging attacks and presents a hardware attack (so-called MAGIC) that maliciously accelerates Negative-Bias Temperature Instability aging effects in processor cores.  By analyzing the structural information of a processor, a sequence of assembly instructions that accelerate the aging process is developed and a program consisting of these instructions is crafted.  By executing this application, the core is maliciously aged and the chip fails sooner than expected.

Biography:

Dr. Naghmeh Karimi is currently an assistant professor in the department of Computer Science and Electrical Engineering at University of Maryland, Baltimore County.  She received a Ph.D. degree in electrical engineering from University of Tehran in 2010.  Before joining UMBC, Dr. Karimi was a visiting researcher at Yale University (2007-2009), a postdoctoral researcher at Duke University (2011-2012), a visiting assistant professor at New York University (2012-2014), and a teaching assistant professor at Rutgers University (2014-2016).

Dr. Karimi's research interests include Design-for-Testability, Design-for-Reliability, Design-for-Security, Computer Architecture, and VLSI.  She has published over 30 papers in journals and refereed conference proceedings and authored three book chapters.

Email:

Address: UMBC, 1000 Hilltop Circle, ITE 314 , Baltimore, Maryland, United States, 21250

Dr. Naghmeh Karimi of University od Maryland, Baltimore County

Topic:

Malicious AGing In Circuits/Cores

Biography:

Email:

Address:Baltimore, Maryland, United States





Agenda

5:30 PM  Complimentary Refreshments and Social Hour

6:15 PM  Seminar by Dr. Naghmeh Karimi: “Malicious AGing In Circuits/Cores”

7:30 PM  Adjourn