Models for Solar Radiation Prediction for Photovoltaic Plant management
MTT/AP, ED/CAS, and SIGHT (Self Interest Group on Humantrian Technology) Talk
The forecasting of solar radiation availability is a key tool for managing photovoltaic (PV) plants, especially in a smart grid scenario. However, the variability of the weather phenomena is an unavoidable obstacle in the prediction of the energy produced. The use of the data collected in the past can be useful to capture the daily and seasonal variability, while measurement of the recent past can be exploited to provide a short term prediction. Since an accurate measurement of the solar radiation requires not only a high class radiometer, but also a correct management of the instrument, the exploitation of data collected by public weather station nearby the solar plant can reduce the costs for the management of the monitoring apparatus. Several prediction techniques belonging from both computational intelligence and statistical fields have been challenged in this task.
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- 154 Summit Street, Newark, NJ 07102
- NJIT
- Newark, New Jersey
- United States 07102
- Building: ECEC
- Room Number: 202
- Click here for Map
- Contact Event Host
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Dr. Ajay K. Poddar, Ph.: 201-560-3806, email:akpoddar@ieee.org
Dr. Durga Misra, +1-973-596-5739, email: dmisra@ieee.org
Dr. Edip Niver, email: edip.niver@njit.edu
- Co-sponsored by AP01/MTT17 & ED/CAS
- Starts 01 June 2017 04:00 PM UTC
- Ends 13 June 2017 04:00 PM UTC
- No Admission Charge
Speakers
Dr. Vincenzo Piuri of Università degli Studi di Milano, Italy
Models for Solar Radiation Prediction for Photovoltaic Plant management
Biography:
Professor Vincenzo Piuri hasreceived his Ph.D. in computer engineering at Politecnico di Milano, Italy (1989). He has been Associate Professor at Politecnico di Milano, Italy and Visiting Professor at the University of Texas at Austin and at George Mason University, USA. He is Full Professor in computer engineering at the Università degli Studi di Milano, Italy (since 2000). His main research interests are: intelligent systems, signal and image processing, machine learning, pattern analysis and recognition, theory and industrial applications of neural networks, intelligent measurement systems, industrial applications, biometrics, fault tolerance, digital processing architectures, embedded systems, and arithmetic architectures. Original results have been published in more than 350 papers in international journals, proceedings of international conferences, books, and book chapters. He is a Fellow of the IEEE, Distinguished Scientist of ACM, and Senior Member of INNS. He has been IEEE Vice President for Technical Activities (2015), IEEE Director, President of the IEEE Computational Intelligence Society, Vice President for Education of the IEEE Biometrics Council, Vice President for Publications of the IEEE Instrumentation and Measurement Society and the IEEE Systems Council, and Vice President for Membership of the IEEE Computational Intelligence Society. He is Editor-in-Chief of the IEEE Systems Journal (2013-17), and has been Associate Editor of the IEEE Transactions on Neural Networks and the IEEE Transactions on Instrumentation and Measurement. He received the IEEE Instrumentation and Measurement Society Technical Award (2002) for the contributions to the advancement of theory and practice of computational intelligence in measurement systems and industrial applications. He is Honorary Professor at the Obuda University, Budapest, Hungary (since 2014), and Guest Professor at Guangdong University of Petrochemical Technology, China (since 2014) and at the Muroran Institute of Technology, Japan (since 2016). More information are available at http://www.di.unimi.it/piuri
Email:
Address:Computer Engineering Department, Università degli Studi di Milano, Italy, Milano, Italy
Agenda
Event Time:6:00 AM to 8:00 PM
5:30:00 PM - Refreshments and Networking
6:00PM-7:30 PM: Talk by Prof. Vincenzo Piuri, Università degli Studi di Milano, Italy
Seminar in ECE 202 All Welcome: There is no fee/charge for attending IEEE technical semiar. You don't have to be an IEEE Member to attend. Refreshmen is free for all attendess. Please invite your friends and colleagues to take advantages of this Invited Distinguished Lecture.