RF Measurements Demystified: an Introduction to VNAs & Microwave Lock-in Amplifiers

#RF/MW #VNA #Amplifier #Phase #Noise
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IEEE North Jersey Section Co-Sponsors the Talk: "RF Measurements Demystified: an Introduction to VNAs & Microwave Lock-in Amplifiers"

 

 

Are you a VNA user interested in microwave lock-in amplifiers, or a lock-in amplifier user seeking a better understanding of VNAs for your research? Perhaps you are new to RF measurements and want an overview of which instrument is best suited for your application? In this webinar, we will clarify the nuances of RF measurements by introducing two key instruments: Vector Network Analyzers (VNAs) and microwave Lock-in Amplifiers. Each of these instruments provides valuable, yet distinct, insights into RF measurements. We will start by discussing Vector Network Analyzers, which are essential for characterizing the behavior of RF components and networks by analyzing their scattering parameters (S-parameters). Following that, we will explore Lock-in Amplifiers, known for their ability to detect and measure small AC signals that are buried in noise, including their recent advances in measuring these signals at RF frequencies. The webinar will cover key principles, operational techniques, and application examples for both types of instruments. It will also feature visual demonstrations and practical tips to enhance your understanding and application of these tools in your work. In this webinar, you will learn:

  • Introduction to RF Measurement Tools: Gain insights into Vector Network Analyzers (VNAs) and microwave Lock-in Amplifiers.
  • Exploring Lock-in Amplifiers: Discover how these instruments detect and measure small AC signals buried in noise, including their applications in RF measurements.
  • Comparison of VNAs and Lock-in Amplifiers: Understand the strengths and differences of each instrument to determine the best fit for your application.
  • Operational Techniques & Applications: Learn key principles, practical techniques, and real-world use cases.

 

 

 

 

 

 

 

 

 

 

 


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  • Ajay Poddar (akpoddar@ieee.org), Edip Niver (edip.niver@njit.edu), Durga Mishra (dmisra@njit.edu), (Anisha Apte (anisha_apte@ieee.org)

     

     

     

     

     

     

     

     

     

     

     

     

     

  • Co-sponsored by IEEE North Jersey Section

  Speakers

Tim Ashworth of Rohde & Schwarz

Topic:

RF Measurements Demystified: an Introduction to VNAs & Microwave Lock-in Amplifiers

In this webinar, you will learn:

  • Introduction to RF Measurement Tools: Gain insights into Vector Network Analyzers (VNAs) and microwave Lock-in Amplifiers.
  • Exploring Lock-in Amplifiers: Discover how these instruments detect and measure small AC signals buried in noise, including their applications in RF measurements.
  • Comparison of VNAs and Lock-in Amplifiers: Understand the strengths and differences of each instrument to determine the best fit for your application.
  • Operational Techniques & Applications: Learn key principles, practical techniques, and real-world use cases.

 

 

 

 

 

 

 

 

Biography:

Tim Ashworth is head of product marketing for test and measurement products at Zurich Instruments, a Rohde & Schwarz company. Before joining Zurich Instruments as an application scientist, Tim obtained his PhD in nanoscale surface science from the University of Manchester, UK. He then used lock-in technology and phase-locked loops to boost the performance of home-built scanning probe microscopes at the University of Basel and later at a spin-off company commercializing these powerful microscopes.

 

 

Address:Rohde & Schwarz,

Joern Pfeifer of Rohde & Schwarz

Topic:

RF Measurements Demystified: an Introduction to VNAs & Microwave Lock-in Amplifiers

In this webinar, you will learn:

  • Introduction to RF Measurement Tools: Gain insights into Vector Network Analyzers (VNAs) and microwave Lock-in Amplifiers.
  • Exploring Lock-in Amplifiers: Discover how these instruments detect and measure small AC signals buried in noise, including their applications in RF measurements.
  • Comparison of VNAs and Lock-in Amplifiers: Understand the strengths and differences of each instrument to determine the best fit for your application.
  • Operational Techniques & Applications: Learn key principles, practical techniques, and real-world use cases.

 

 

 

Biography:

 

Jörn Pfeifer studied Electronics Engineering at the University of Applied Sciences in Emden, Germany, and graduated with a degree in High-Frequency Engineering. He joined Rohde & Schwarz in 2016 as an application engineer and focuses on high-speed digital design applications. He is a contributing member of the OPEN Alliance Automotive Ethernet TC9 working group.

 

Address:Munich, Germany