Prof. Souvik Mahapatra

This talk will begin with the basics of Bias Temperature Instability (BTI) and Hot Carrier Degradation (HCD) induced performance degradation in CMOS devices and circuits. A comprehensive reliability model will be introduced, which has been implemented in TCAD and also as a standalone code in SPICE. Various examples of modeling of measured data from GAA FETs will be shown. Finally, the activity (mission profile) and Dynamic Voltage Frequency Scaling (DVFS) analysis  in circuits will be discussed. 

Biography:

Souvik Mahapatra is a professor of Engineering at IIT Bombay. His research area is reliability of CMOS and Flash memory devices and CMOS circuits. He works closely with several semiconductor industries in the fab, fabless, fabtool and EDA space. He is a fellow of IEEE, INSA, INAE and IASc.