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Workshop on Reliability and Security of Microelectronics
#microelectronics
#aging
#security
#monitoring
#trust
#sensors
Cátedra USECHIP of University of Sevilla, IEEE CEDA Spain Chapter and Instituto de Microelectrónica de Sevilla organize:
Workshop on Reliability and Security of Microelectronics
Smart, Secure, and Built to Last?
The microelectronics industry is entering a new era. As chips get smaller, faster, and more connected, they become more vulnerable to aging, attacks, and unpredictable failures. This two-day workshop brings together leading voices from academia and industry to discuss how reliability and security must evolve hand-in-hand.
From aging sensors and predictive health monitoring to AI-assisted design and tamper detection, we will push past today’s limits to ask:
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- What failures and threats await us at advanced technology nodes?
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How do we make microchips that can survive a hostile world?
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What will kill our chips first — aging, attacks, or our own assumptions?
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How should the industry rethink reliability and security co-design for the next decade?
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What skills and technologies will define the next decade of secure, trustworthy electronics?
Join us for talks, discussions, and a high-stakes panel entitled “When Chips Grow Old and Enemies Get Smarter” designed to leave you thinking about how the chips of tomorrow will endure – and how you can be part of building them.
+ info and free registration at: https://catedra.us.es/usechip/noticias/workshop-reliability-and-security-microelectronics
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- Avda. Americo Vespucio, 28
- Sevilla, Andalucia
- Spain 41092
- Building: Instituto de Microelectronica de Sevilla
- Room Number: Salon de Grados