Dynamic Offset-Cancellation Techniques Prof. Kofi Makinwa
In modern CMOS processes, device mismatch typically results in offset voltages of several millivolts. But many sensor interfaces require much lower offset levels. By using dynamic offset cancellation techniques such as auto-zeroing and chopping, however, microvolt levels of offset can be routinely achieved.
In this lecture, an introduction to the theory of auto-zeroing and chopping will be given, and the pros and cons of both techniques will be discussed. Examples will be given of the use of auto-zeroing and chopping in sensor interfaces with residual offsets as low as 50nV.
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- Gloriastrasse 35
- Zurich, Switzerland
- Switzerland 8092
- Building: ETZ building
- Room Number: E81
Speakers
Prof. Kofi Makinwa
Biography:
Kofi A. A. Makinwa (Fellow, IEEE) received the B.Sc. and M.Sc. degrees from Obafemi Awolowo University, Ife, Nigeria, in 1985 and 1988, respectively, the M.E.E. degree from the Philips International Institute, Eindhoven, The Netherlands, in 1989, and the Ph.D. degree from Delft University of Technology, Delft, The Netherlands, in 2004.
From 1989 to 1999, he was a Research Scientist with Philips Research Laboratories, Eindhoven, The Netherlands.
Since 1999, he has been at Delft University of Technology, where he is an Antoni van Leeuwenhoek Professor and the Head of the Microelectronics Department. His research interests include the design of mixed-signal circuits, sensor interfaces and smart sensors. This has led to 20+ books, 350+ technical papers, and 40+ patents.
Dr. Makinwa was the Analog Subcom chair of ISSCC from 2018 to 2021, and has served on the program committees of several other IEEE conferences. He has also been a distinguished lecturer of the Solid-State Circuits Society and an elected member of its Adcom. He is currently a member of the executive committee of the VLSI symposium and a co-chair of the Advances in Analog Circuit Design (AACD) workshop and the IEEE Sensor Interfaces Meeting (SIM). Dr. Makinwa is the co-recipient of 18 best paper awards, from the JSSC, ISSCC and VLSI symposium, among others. In 2023, at the 70th anniversary of ISSCC, he was recognized as its top contributing author, with 70+ papers. He is a member of the Royal Netherlands Academy of Arts and Sciences.
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