Detectus EMC Scanner - EMI Troubleshooting Made Easy

#EMC #EMI #Scanner
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Looking to accelerate your product development while cutting down on the time and cost of EMC compliance?

 

Detectus SCN-534 EMC Scanner from Pendulum Instruments is your go-to solution for fast, accurate near-field scanning—helping you identify emissions early in the design stage.

Why attend?

·       Detect EMC issues before they become costly

·       Speed up debugging and design iterations

·       Integrate seamlessly into your existing workflow.

 

💡 Curious how it works?


Join us for this free and interactive session, including a live Q&A with our expert, Neill Harlen.


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  • Starts 26 August 2025 04:00 PM UTC
  • Ends 19 September 2025 04:00 PM UTC
  • No Admission Charge

  Speakers

Neill

Topic:

Detectus EMC Scanner - EMI Troubleshooting Made Easy

Looking to accelerate your product development while cutting down on the time and cost of EMC compliance?

 

Detectus SCN-534 EMC Scanner from Pendulum Instruments is your go-to solution for fast, accurate near-field scanning—helping you identify emissions early in the design stage.

Why attend?

·       Detect EMC issues before they become costly

·       Speed up debugging and design iterations

·       Integrate seamlessly into your existing workflow.

 

💡 Curious how it works?


Join us for this free and interactive session, including a live Q&A with our expert, Neill Harlen.

 

Interfax Systems and Pendulum Team

Biography:

Neill Harlen is a Technical Representative and Sales Manager at Interfax Systems, the North American distributor for the Detectus EMC scanning system, providing sales, support, and training since 2002. Neill Harlem has been in the Test &Measurement equipment industry for 30 years and is a Detectus Scanner Ambassador for North America.




Agenda

Looking to accelerate your product development while cutting down on the time and cost of EMC compliance?

 

Detectus SCN-534 EMC Scanner from Pendulum Instruments is your go-to solution for fast, accurate near-field scanning—helping you identify emissions early in the design stage.

Why attend?

·       Detect EMC issues before they become costly

·       Speed up debugging and design iterations

·       Integrate seamlessly into your existing workflow.

 

💡 Curious how it works?


Join us for this free and interactive session, including a live Q&A with our expert, Neill Harlen.