INSPIRE talk - Industrial IC Test & Diagnosis: Issues & Challenges
As the semiconductor industry evolves to meet the demands of the fast-growing automotive market and the transition to 3D transistor technologies, new challenges are emerging across the entire design and manufacturing flow. This talk will focus on the critical role of test and diagnosis in ensuring reliability and performance in these advanced applications. In the automotive sector, compliance with stringent standards such as ISO 26262 and achieving near-zero DPPM rates are essential. The increasing integration of high-performance computing for autonomous driving—requiring real-time sensor fusion from cameras, radars, and LiDARs—drives the need for cutting-edge technology nodes and robust test strategies. Additionally, the shift to 3D transistors introduces new complexities in fault detection and diagnosis, requiring innovative approaches to maintain yield and quality. Through practical examples and case studies, this presentation will explore how test and diagnosis methodologies must evolve to support these next-generation technologies.
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