2026 Microelectronics Design and Test Symposium
35th annual symposium
The IEEE Microelectronics Design & Test Symposium (MDTS) provides a forum for academia and industry to learn about the latest advances in microelectronics and to share research and design work. The Symposium environment fosters academic-industry collaboration with tutorials, a guided panel, invited speakers, original research papers, including hosting student original research communications. The conference covers a broad spectrum of microelectronics technologies, , including but not limited to:
- Electronic Testing Technologies
- Design for Test
- Electronic Design Automation (EDA)
- Yield Analysis and Optimization
- Hardware and System Security
- Reliability and Resilience
- Analog/Mixed Signal/RF Circuits and Systems
- Nanoelectronics, Magnetic, Optoelectronics Materials and Devices
- Neuromorphic Engineering
- Quantum Computing
- Power Electronics
- Biomedical, Photonics, and Quantum Electronics
- Sensory Circuits and Systems
- Signal Processing
- Artificial Intelligence (AI) in Electronics
- Beyond-CMOS Nanoelectronics
- Heterogeneous Integration and Packaging
- Wide Bandgap Technologies
- Semiconductor Digital Twins
- Emerging Technologies and Applications
More details will be added as we get closer to the event. Check out our MDTS website or scan the QR code below.
Note: The currently listed location and start/end times are tentative, but are representative of the expected location and start/end times.
Date and Time
Location
Hosts
Registration
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- 660 Albany Shaker Rd
- Crowne Plaza Albany - the Desmond Hotel
- Albany, New York
- United States 12211
- Starts 19 January 2026 05:00 AM UTC
- Ends 21 May 2026 04:00 AM UTC
- No Admission Charge
Agenda
To be determined