Didier Theilliol of CRAN CNRS UMR 7039, University of Lorraine, Vandoeuvre, France

Technical presentation by Pr Didier Theilliol

Biography:

Didier Theilliol (Member, IEEE) is currently a Professor with CRAN, Université de Lorraine. He coordinates and leads national, European, and international research and development projects. He has advised 16 Ph.D. students and published over 60 international journals articles/200 international conference papers and a book entitled Fault-tolerant Control Systems: Design and Practical Applications (2009). His current research interests include health aware control systems, including model-based FDI method synthesis and active FTC system design for LTI, LPV, multi-linear systems, and reliability analysis. He was the General Chair and the Program Chair of various international conferences sponsored by IEEE and IFAC (Systol, ICUAS, MED, MMM, Safeprocess, and EACD). He is one of European Advanced Control and Diagnosis (EACD) and SysTol Association Steering Committee Member. His main contributions in academy and technology are illustrated through its official position as an expert in various committee (Academic of Finland, ArcelorMittal European Committee, IFAC Technical Committee 6.2. and 6.4., Ph.D. Jury Spain, Australia, Canada, Mexico, and French Research National Agency in 2011 and 2014). He was an Associate Editor of IEEE Transactions on Reliability (2013–2016) and Unmanned Systems (2012–2017). He is also an Associate Editor of ISA Transactions, Journal of Intelligent and Robotic Systems, and International Journal of Applied Mathematics and Computer Science.

Email:

Address:2, rue Jean Lamour , , Vandoeuvre les Nancy, Lorraine, France, 54509

Mayank Shekhar Jha of CNRS CRAN Universite de Lorraine, Nancy, France

Technical presentation by Dr. Mayank Shekhar JHA

Email:

Address:2, rue Jean Lamour, , Vandoeuvre les Nancy, Lorraine, France, 54509

Patricia Desgreys of C2S Team ComElec Dept. LTCI, Télécom Paris, Institut Polytechnique de Paris, Palaiseau, France

Non technical presentation by Pr Patricia Desgreys 

Biography:

Patricia Desgreys (M’00–SM’12) received the M.Sc. and Ph.D. degrees in microelectronics from the University of Bordeaux, in 1996 and 1999, respectively. Since 2000, she has been with the Institute Mines Telecom, Telecom ParisTech, where she is currently a Professor with the Communications and Electronics Department, heading the Circuit and Communication Systems Group. She is also in charge of research on the Wireless Systems and Design Techniques for Nanoscale Circuits with special emphasis on software and cognitive radio system and smart AMS systems for IoT. She has co-authored over 100 technical publications mainly on international journals (19) and international conference proceedings (52) and has been involved in many collaborative projects. She is currently involved in the international animation of the CAS community, in particular, the President of the IEEE-CAS France since 2015 and the Technical Program Chair of the IEEE NEWCAS in 2012 and 2013.

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François Deborgies of European Space Research and Technology Center (ESTEC) European Space Agency (ESA), Noordwijk, The Netherlands

Technical presentation by Dr. François Deborgies

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Bertrand Ardouin of III-V Lab a joint Laboratory of Nokia Bell Laboratories Thales, and CEA LETI, Palaiseau, France

Technical presentation by Dr. Bertrand Ardouin

Biography:

Bertrand Ardouin (Member, IEEE) received the M.S. and Ph.D. degrees in electrical engineering from the University of Bordeaux, Bordeaux, France, in 1998 and 2001, respectively.,In 2002, he has been the Co-Founder of XMOD Technologies, Bordeaux, a start-up he has led as a CEO and a Research and Development Director until 2019. After the acquisition of XMOD Technologies by SERMA Group, he has been the Business Unit Manager with SERMA Technologies, Pessac, France, in charge of electrical expertise and environmental tests and responsible compact modeling activities. He is currently responsible of the High-Speed Analog Digital Interfaces Group, III-V Lab, Palaiseau, France. His areas of interest cover CMOS, SiGe, and InP HBT devices, harsh-environment electronics, reliability, RF and mmWave characterization, modeling and PDK, process technology, statistical modeling, and high-speed IC design

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