From Process to Performance: Challenges in uOLED and uLED Electronics Manufacturing
-- emissive display systems, high-volume, process variability, optical non-uniformity, reliability challenges ...
As uOLED and uLED technologies transition from research to high-volume manufacturing, system performance is increasingly constrained by process variability rather than design intent. Electrical, thermal, and mechanical decisions made during manufacturing directly translate into optical non-uniformity, efficiency loss, and reliability challenges. Understanding these process-to-performance linkages is critical for building scalable, high-performance emissive display systems.
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- Starts 19 January 2026 08:00 AM UTC
- Ends 12 May 2026 07:00 AM UTC
- No Admission Charge
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Biography:
Pavan Shivareddy is a senior engineering leader working at the intersection of display electronics, optical performance, and system integration for highly constrained consumer hardware platforms. His industry experience spans Apple and Meta, where his work has focused on understanding how manufacturing processes, packaging, and electronics variability translate into system-level optical performance at scale. Pavan’s interests include uOLED and uLED performance, system-in-package co-design, and validation methodologies for high-volume emissive displays.
Address:United States