Precision Characterization of Wide-Bandgap Power Devices using Double Pulse Testing and Isolated Measurements

#device #measurement-techniques #switching
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Wide-bandgap power devices such as SiC and GaN require precise measurement techniques to accurately evaluate fast switching behavior. Double Pulse Testing (DPT) is widely used to characterize switching losses and dynamic device performance. However, accurate measurements of high-side floating nodes remain challenging due to high common-mode voltage and noise.
This talk introduces practical Double Pulse Testing techniques and demonstrates how isolated measurement technology enables high-fidelity waveform capture for improved switching analysis and power device characterization.


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  • 1 Punggol Coast Road
  • Singapore, Singapore
  • Singapore 828608
  • Building: W5-02-03
  • Room Number: Lectorial 4
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  Speakers

CK Teo of Tektronix

Topic:

Precision Characterization of Wide-Bandgap Power Devices using Double Pulse Testing and Isolated Measurements

Biography:

CK Teo is the Chief Technical Officer of Measurement & Metrology Group, bringing over 19 years of expertise in test and measurement solutions. He has a strong background in semiconductor characterization, system integration, and technical solution development. Throughout his career, he has played a key role in advancing curve tracer solutions and optimizing measurement systems for various industries, including education, the private sector, and government-linked companies. Before becoming CTO, he worked as a Technical Consultant and Project Manager, leading business development and engineering solution design. He also held positions at Tektronix and Micro Modular System, focusing on field applications, R&D, and test automation. CK Teo holds a Master’s Degree in Physics (Remote Sensing) from USM, specializing in optical instrumentation and image processing. His passion lies in bridging industry and academia, fostering innovation, and developing cutting-edge solutions for semiconductor testing and measurement.