Updates on Neutral Prior Corrections for Bayesian Quality and Reliability Estimation and Test Planning
This event will be hybrid, but we encourage in-person attendance. Registration is free, but is required so that we can plan pizza, salad, and beverages.
When arriving Wednesday evening, please be prepared to show a government-issued photo ID, such as a drivers license, at the main gate at Wood Street. State that you are attending the IEEE Reliability meeting in the Main Cafeteria.
After parking, walk towards the main building near the flagpole. Before entering, look left, and walk down the steps. At the bottom of the steps, turn right. Walk straight through the double set of double doors and straight into the Main Cafeteria.
Looking forward to seeing you in person!
Dan Weidman
Chair, IEEE Boston Reliability Chapter
Date and Time
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- MIT Lincoln Laboratory
- 244 Wood St
- Lexington, Massachusetts
- United States 02421
- Building: Main Cafeteria
- Click here for Map
- Starts 17 April 2026 06:00 PM UTC
- Ends 05 May 2026 06:00 PM UTC
- No Admission Charge
Speakers
Charlie of ASMPT NEXX, Billerica, MA, US
Updates on Neutral Prior Corrections for Bayesian Quality and Reliability Estimation and Test Planning
–As a followup from the March 2022 Boston Chapter presentation, we present updates on the adoption of neutral prior corrections to widely used reliability and quality estimation and test planning methods.
–In addition to conference presentations and podcast episode coverage, and a citation in a popular reliability engineering textbook, we review current status on inclusion of the correction into various engineering standards.
–We also present additional details into the statistical and mathematical underpinnings of the foundational 2021 IIRW workshop paper formulae.
Biography:
–Senior Manager of Quality and Reliability
–ASMPT NEXX, Billerica, MA
–Dr. Charles H Recchia, has held technology development, reliability engineering and director-level positions at AMD, Intel Corporation, MKS Instruments, Saint-Gobain, Raytheon Integrated Defense Systems, MACOM, and currently ASMPT NEXX
–Ph.D. in Experimental Solid-State Physics from Ohio State University
–MBA from Babson College
–visiting academic appointments: Wittenberg University and Worcester Polytechnic Institute
–author on 3 semiconductor technology patents
–20+ peer-reviewed publications
–Senior Member of IEEE
–Served 3-year extended term as IEEE Reliability Boston Chapter Chair, 2015-2017
Address:Massachusetts, United States
Agenda
5:00 pm doors open, for networking. Arriving earlier is ok.
5:30 pm: Dinner and refreshments are scheduled to arrive, while networking continues.
6:00 pm: Introduction to the presentation, followed by the formal presentation.
Between 7 and 7:30 pm: Formal presentation and formal Q&A end.
8:00 pm: Informal Q&A and networking end.