Jens Medler

This presentation provides an overview of the latest developments within the CISPR standard series, with a focus on updates to measurement instrumentation, test methodologies, and the evolving treatment of measurement uncertainty. Drawing on active participation in CISPR subcommittees CIS/A and CIS/I, the presenter will highlight key changes affecting EMC compliance testing across information technology and multimedia applications.

Topics will include recent revisions to CISPR 16 measurement instrumentation requirements, advances in FFT-based measurement techniques, and updates emerging from CIS/I MT7 on revision of CISPR 32. The presentation will also address how these standards developments impact test equipment selection, laboratory practice, and product compliance strategies.

Attendees will leave with a clearer understanding of the current state of CISPR standardization and practical guidance on preparing for upcoming changes.

Biography:

Jens Medler Product Manager, Standardization & Application Support – EMI Test Equipment, Rohde & Schwarz, Munich, Germany

Jens Medler has been with Rohde & Schwarz since 1996, where he manages standardization and application support for EMI test receivers and accessories.

He is a Senior Member of the IEEE EMC Society and serves as Vice Chair of the IEEE EMC Standards Development and Education Committee. He has been active in CISPR subcommittees since 1999, contributing to CIS/A (EMC measurement instrumentation and methods), CIS/D (equipment for vehicles), and CIS/I (information technology).

Since 2017, Jens has served as convener of CIS/A WG2, which focuses on EMC measurement methods, statistical techniques, and measurement uncertainty.

He is a recipient of the IEC 1906 Award and the IEEE EMCS Technical Achievement Award, recognizing his contributions to international electrotechnical standardization. His research work includes topics such as the treatment of measurement instrumentation uncertainty in accordance with CISPR 16-4-2