Failure Analysis Workshop 2026 – Advancing Semiconductor Reliability in the AI Era
Failure Analysis Workshop at UT Austin: Advancing Semiconductor Reliability in the AI Era
The Texas Institute for Electronics at UT Austin is hosting a full-day failure analysis workshop, and HKN members are encouraged to attend!
Date: Friday, October 9, 2026
Time: 8:45 AM – 6:00 PM
Location: UT Austin
Register here: https://tinyurl.com/53s9uean
What to expect:
- Industry keynote and technical presentations
- Real-world case studies and failure analysis techniques
- Panel discussion with FA directors, principal engineers, and research scientists
- Networking reception
- Gallery of winning FA photos and videos
Featured speakers from: FA Instruments, Fischione, imec, Intel, Microchip, NIST, SanDisk, SEMICAPS, TeraView, Texas Instruments, TSMC, and Ultratec
Why go?
- See specialized FA tools, workflows, and career paths up close
- Get exposure to real-world semiconductor failure analysis challenges
- Meet students and industry partners from across Central Texas
Date and Time
Location
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- 204 E Dean Keeton St
- Austin, Texas
- United States 78712
- Building: EER 2.518
- Starts 02 October 2026 05:00 AM UTC
- Ends 09 October 2026 05:00 AM UTC
- No Admission Charge