Optimizing Power Integrity for GaN-Based Systems: From PDN Design to Precise Measurement
Abstract: As power electronics migrate toward GaN technology, the margin for error in Power Distribution Network (PDN) design has vanished. Dynamic loads such as GPUs used in AI applications present new measurement challenges. This presentation provides a comprehensive framework for ensuring Signal and Power Integrity (SIPI) in high-frequency power stages. By utilizing the Rohde & Schwarz MXO series oscilloscopes, we demonstrate a streamlined workflow for characterizing PDN performance and verifying PDN stability. We will also discuss the use of isolated probing for precise voltage and current measurement. Discover how to bridge the gap between simulation and real-world measurement to accelerate your time-to-market for high-efficiency power solutions.
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Optimizing Power Integrity for GaN-Based Systems: From PDN Design to Precise Measurement
As power electronics migrate toward GaN technology, the margin for error in Power Distribution Network (PDN) design has vanished. Dynamic loads such as GPUs used in AI applications present new measurement challenges. This presentation provides a comprehensive framework for ensuring Signal and Power Integrity (SIPI) in high-frequency power stages. By utilizing the Rohde & Schwarz MXO series oscilloscopes, we demonstrate a streamlined workflow for characterizing PDN performance and verifying PDN stability. We will also discuss the use of isolated probing for precise voltage and current measurement. Discover how to bridge the gap between simulation and real-world measurement to accelerate your time-to-market for high-efficiency power solutions.
Biography:
Mike Schnecker is a Digital Test & Measurement Technologist and Business Development Manager at Rohde & Schwarz, an oscilloscope expert specializing in high‑speed signal analysis, power integrity, and high‑speed serial interfaces. He helps engineers with troubleshooting, waveform characterization, and standards‑compliant testing, delivering practical, demo‑driven insights that optimize measurement and test systems.
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