Richelieu Quoi

Wireless technologies continue to evolve rapidly, creating new challenges for RF exposure evaluation, SAR testing, and global regulatory compliance. This presentation will provide an industry perspective on emerging developments in RF exposure testing, with a focus on Mexico IFT requirements, evolving SAR test methodologies, and the challenges associated with supporting new wireless technologies.

The presentation will also explore developments in international regulatory cooperation and mutual recognition, along with opportunities to improve the acceptance and reuse of test data across markets. Finally, it will look at how automation, data-driven workflows, and AI-assisted approaches may support increasingly complex testing and compliance activities.

Biography:

Richelieu Quoi leads Innovation and Emerging Technology for EMC/Wireless North America at UL Solutions. His work focuses on emerging wireless technologies, RF exposure and SAR testing, regulatory compliance, and practical testing strategies for evolving technologies and global market requirements. He also contributes to IEC /IEEE technical working groups for RF exposure standard development.

Address:United States

Valéry Ray

Charged particle beam instruments, such as particle accelerators, focused ion beam instruments, or electron microscopes, are uniquely sensitive to EMI due to nature of particles employed by these instruments: a beam of charged particles traveling through space is a form of electric current, directly interacting with electrical and magnetic fields. One of largely unresolved inherent problems in particle beam instrumentation is EMI from noise currents galvanically injected into the chassis of the instrument from protective earth (PE) terminals on variety of EMC filters and power supplies. We will discuss EMI in particle beam instruments and a recently published US20260221373A1 potential solution eliminating interference from galvanically injected noise currents.

Biography:

Valéry Ray is particle beam instrumentation technologist that worked with multiple manufacturers of scanning electron microscopy (SEM) and focused ion beam (FIB) equipment: Opal, AMAT, Micrion, FEI/Thermo since 1995, and been a self-employed consultant on particle beam instrumentation technology between 2004 and 2024. He is currently a principal electron optics engineer at ASML Silicon Valley working single- and multi-electron beam technologies.

Address:United States