Calibration of high speed, high performance digital-to-analog converters (DL- Gabriele Manganaro)

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Traditional calibration techniques are effective at compensating for static nonidealities. However, as clock rates and signal frequencies continue to increase, dynamic errors have become increasingly significant contributors to output spectral purity. Direct measurement of these dynamic error sources is not only extremely challenging, but can also exacerbate the errors themselves. In response, recent years have seen the emergence of new approaches focused on assessing the impact of dynamic errors and actively mitigating them, yielding promising results. Simultaneously, time-interleaved DACs (TI-DACs) are gaining traction. While many of the challenges faced by TI-DACs are similar to those encountered with time-interleaved ADCs (TI- ADCs), the correction or calibration of time-interleaving errors in TI-DACs often must be performed in the analog domain, presenting a unique set of challenges. This presentation provides an overview of some of the most interesting and innovative recent developments in this area.


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  • 100 Institute Road
  • Worcester, Massachusetts
  • United States 01609
  • Building: Atwater Kent Labs
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  • Starts 09 November 2026 05:00 AM UTC
  • Ends 12 November 2026 05:00 AM UTC
  • No Admission Charge

  Speakers

MediaTek

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Gabriele Manganaro

Gabriele Manganaro (Fellow, IEEE) received his Dr.Eng. and Ph.D. degrees in electronics from the University of Catania, Italy. He is currently a Director of Technology at MediaTek, Woburn, MA, USA, and previously worked for Analog Devices, National Semiconductor and Texas Instruments in both product design and research roles in mixed-signal IC design, primarily for data converters and PLLs/DLLs. Dr. Manganaro coauthored over 70 peer-reviewed papers and three books, notably Advanced Data Converters (Cambridge University Press, 2011), and holds 20 U.S. patents. He was elevated to IEEE Fellow in 2016 and IET Fellow in 2009.